Interferometric filter wavelength meter and controller
View Patent ↗A wavelength measurement system uses birefringent material waveplate, thereby producing a substantially sinusoidal spectral response. As a result, the responses of multiple birefringent filters can be combined to yield a filter system with a periodic frequency response that has an additive wavelength resolution that is spectrally stable. That is, the wavelength measurement system does not have regions where wavelength resolution is degraded. In one implementation, a waveplate system 112 is used, placed between two blocks of birefringent material 110 and 114 . A quadrant detector 116 is used to detect the intensities of the resulting four beams.
1. A system, comprising
a birefringent filter system that applies multiple spectral filtering characteristics to an input beam;
a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics, the detector system comprising at least two detectors, each one of the detectors for detecting the beam after being filtered by different suectral filtering characteristics; and
a controller that analyzes the input beam in response to the detector system and modulates a wavelength of a semiconductor laser system generating the input beam in response to the detector system.
2. A system as claimed in claim 1 , wherein the birefringent filter system comprises birefringent material.
3. A system as claimed in claim 1 , wherein the birefringent filter system comprises a birefringent waveplate placed between two birefringent blocks.
4. A system, comprising
a birefringent filter system that applies multiple spectral filtering characteristics to an input beam and comprises two parallel waveplates placed between two birefringent material blocks;
a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics; and
a controller that analyzes the input beam in response to the detector system and modulates a wavelength of a semiconductor laser system generating the input beam in response to the detector system.
5. A system as claimed in claim 1 , wherein a diameter of the input beam is less than 400 μm.
6. A system as claimed in claim 1 , wherein a diameter of the input beam is less than 150 μm.
7. A system as claimed in claim 1 , wherein the length of the birefringent filter system is less than 20 mm.
8. A semiconductor laser system with spectral control, the system comprising:
a semiconductor laser system that generates a polarized output beam;
a spectral detection system, comprising
a birefringent filter system that applies multiple spectral filtering characteristics to an input beam from the laser system; and
a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics; and
a controller that modulates a wavelength of operation of the semiconductor laser system in response to the detector system.
9. A system as claimed in claim 8 , further comprising a beam splitter outside of a laser cavity of the semiconductor laser system that provides a portion of the output of the laser system as the beam received by the spectral detection system.
10. A detection system, comprising
a birefringent filter system that applies multiple spectral filtering characteristics to an input beam, the multiple spectral filtering characteristics jointly have a substantially similar spectral resolution;
a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics, the detector system comprising at least two detectors, each one of the detectors for detecting the beam after being filtered by different spectral filtering characteristics; and
a controller that analyzes the input beam in response to the detector system.
11. A system as claimed in claim 10 , wherein the range of interest is a free spectral range of the filter system.
12. A system as claimed in claim 10 , wherein the filter system comprises a waveplate placed between two birefringent blocks.
13. A system as claimed in claim 10 , wherein the filter system comprises two parallel waveplates placed between two birefringent material blocks.
14. A system as claimed in claim 10 , wherein a diameter of the input beam is less than 400 μm.
15. A system as claimed in claim 10 , wherein a diameter of the input beam is less than 150 μm.
16. A method for analyzing an input beam, the method comprising
transmitting the input beam through bireflingent material;
transmitting the input beam through two different waveplates;
transmitting the input beam through birefringent material again;
detecting the intensity of multiple beams resulting from the input beam; and
analyzing the input beam by reference to the multiple beams.
17. A detection system, comprising
an interferoinetric filter system that applies multiple sinusoidal spectral filtering characteristics to an input beam;
a detector system for detecting the beam after being filtered by the multiple spectral filtering characteristics; and
a controller that analyzes the input beam in response to the detector system.
18. A system as claimed in claim 17 , wherein the filter system comprises an interferometer.
19. A system as claimed in claim 18 , wherein the interferometer is a multiple arm interferometer.
20. A system as claimed in claim 18 , wherein the interferometer is a single arm interferometer including birefringent material.
21. A system as claimed in claim 17 , wherein the filter system comprises a beam splitter.
22. A system as claimed in claim 17 , wherein the filtering system and the beam splitter comprises birefringent material.
23. A system as claimed in claim 17 , wherein the filter system comprises two birefringent beam splitters with intervening waveplates.