IP Library Granted Patent US 6,987,983
Granted Patent B2
US 6,987,983 · App. 10/396,361 · Granted Jan 17, 2006

Radio frequency monolithic integrated circuit and method for manufacturing the same

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Quick Facts
Patent No.
US 6,987,983
App. No.
10/396,361
Granted
Jan 17, 2006
Kind
B2
Abstract

The purpose of this invention is to realize a radio frequency monolithic integrated circuit high in performance, small in size and low in cost, where transistors and passive elements are arranged on a chip in which a conductive silicon substrate functions as a ground. Since the electromagnetic fields of passive elements induce a current in a conductive silicon substrate, a loss due to generation of Joule heat or the like occurs to lead to deterioration of the performance of the passive elements. To solve this problem, an SOI layer comprising a semiconductor layer having a large thickness and a high resistivity and a conductive silicon substrate is used, and passive elements and an active element are formed on the same substrate. Alternatively, a cavity is provided in the conductive substrate directly beneath the SOI layer in the region where the passive elements are formed, thereby attaining the object.

Claims (31)

1. A radio frequency monolithic integrated circuit comprising:

a conductive substrate having a first resistivity;

a first insulation film formed on a face of said conductive substrate;

a semiconductor substrate provided on said first insulation film and having a second resistivity higher than said first resistivity;

a second insulation film provided on said semiconductor substrate;

an active element formed in one region of said semiconductor substrate;

a passive element provided on said second insulation film; and

a conductive region which penetrates through said semiconductor substrate, said first insulation film and said second insulation film and which connects a predetermined terminal of said active element and said conductive substrate to each other.

2. A radio frequency monolithic integrated circuit as set forth in claim 1 , wherein the thickness of said semiconductor substrate is greater than the thickness of said second insulation film or the thickness of a metal film formed on said second insulation film.

3. A radio frequency monolithic integrated circuit as set forth in claim 1 , wherein the thickness of said semiconductor substrate is greater than the sum of the thicknesses of said second insulation film and said metal film.

4. A radio frequency monolithic integrated circuit as set forth in claim 1 , wherein said second resistivity is not less than 100 Ω·cm.

5. A radio frequency monolithic integrated circuit as set forth in claim 1 , wherein a recessed portion as a cavity is provided in a region directly beneath said passive element, in said conductive substrate.

6. A radio frequency monolithic integrated circuit as set forth in claim 5 , wherein an insulating material is buried in said recessed portion.

7. A radio frequency monolithic integrated circuit as set forth in claim 1 , wherein said conductive region in said semiconductor substrate is composed of a plurality of adjacent regions, and a region having a resistivity lower than that of the other regions of said semiconductor substrate is present between said adjacent conductive regions.

8. A radio frequency monolithic integrated circuit as set forth in claim 1 , wherein said passive element comprises a microstrip line in which a metal film on said second insulation film is used as an upper electrode, and said semiconductor substrate is used as a lower electrode.

9. A radio frequency monolithic integrated circuit as set forth in claim 1 , wherein said active element is a power amplifying transistor, and said passive element is an impedance matching inductor or capacitance or a microstrip line.

10. A radio frequency monolithic integrated circuit as set forth in claim 9 , wherein said power amplifying transistor is a bipolar transistor.

11. A radio frequency monolithic integrated circuit as set forth in claim 10 , wherein a base layer of said bipolar transistor is made of a silicon-germanium alloy.

12. A method for manufacturing a radio frequency monolithic integrated circuit, comprising the steps of:

bonding a conductive substrate having a first resistivity and a semiconductor substrate having a second resistivity higher than said first resistivity to each other, with a first insulation film provided on said semiconductor substrate therebetween, and thinning said semiconductor substrate to a film with a predetermined thickness;

forming a second insulation film on said semiconductor substrate;

forming an active element in one region of said semiconductor substrate, and forming a passive element on said second insulation film; and

forming a conductive region which penetrates through said semiconductor substrate, said first insulation film and said second insulation film and which connects a predetermined terminal of said active element and said semiconductor substrate to each other.

13. A method for manufacturing a radio frequency monolithic integrated circuit as set forth in claim 12 , further comprising the steps of:

providing a groove which penetrates through said semiconductor substrate, said first insulation film and said second insulation film;

burying a polycrystalline semiconductor material containing an impurity in a high concentration into said groove; and

heat-treating said high-concentration impurity to diffuse said impurity into said semiconductor substrate.

14. A method for manufacturing a radio frequency monolithic integrated circuit as set forth in claim 12 , further comprising the steps of:

providing a recessed portion in said conductive substrate; and

bonding said semiconductor substrate to said conductive substrate provided with said recessed portion, with said first insulation film therebetween.

15. A method for manufacturing a radio frequency monolithic integrated circuit as set forth in claim 14 , further comprising the step of burying an insulating material in said recessed portion.

Assignments (4)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
CHANGE OF NAME Recorded Sep 9, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024973/0099 →
MERGER Recorded Sep 9, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024982/0040 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2003
From: HITACHI, LTD.
To: RENESAS TECHNOLOGY CORPORATION
Reel/Frame 014244/0278 →