Thin film semiconductor device
View Patent ↗In a film semiconductor device according to the present invention, a continuous oscillating light beam from a solid laser or the like is modulated on time axis and spatially, thereby realizing crystal growth that is nearly optimum for a crystal structure and growth speed of crystals in a Si thin film. Crystal grains with a large diameter, flatness with no projections at their grain boundaries, and controlled surface orientations are thereby formed. By forming channels with these crystal grains, high mobility semiconductor devices and an image display device using these semiconductor devices are realized.
1. A thin film semiconductor device comprising an insulating substrate, a Si thin film formed over the insulating substrate, a transistor including a source and a drain formed by using parts of the Si thin film, a gate insulation film formed on the Si thin film, a gate formed over the gate insulation film, and a channel constituted by the Si thin film, wherein
surface roughness of the Si thin film or the source or the drain, the gate insulation film, or the gate, which is a height difference between a top of a convex portion thereof and a bottom of a concave portion thereof, within the channel in a direction parallel to the substrate differs from the surface roughness in a direction perpendicular to the direction parallel to the substrate.
2. The thin film semiconductor device according to claim 1 , wherein the surface roughness of the Si thin film or the source or the drain, the gate insulation film, or the gate, which is the height difference between the top of the convex portion thereof and the bottom of the concave portion thereof, within the channel in a channel length direction connecting the source and the drain in particular is smaller than the surface roughness in a channel width direction perpendicular to the channel length direction and parallel to a surface of the Si thin film.
3. The thin film semiconductor device according to claim 1 , wherein the surface roughness of the Si thin film or the source or the drain, the gate insulation film, or the gate, which is the height difference between the top of the convex portion thereof and the bottom of the concave portion thereof, within the channel in a channel length direction connecting the source and the drain in particular is larger than the surface roughness in a channel width direction perpendicular to the channel length direction and parallel to a surface of the Si thin film.
4. A thin film semiconductor device comprising an insulating substrate, a Si thin film formed over the insulating substrate, a plurality of transistors including sources and drains formed by using parts of the Si thin film, a gate insulation film formed on the Si thin film, gates formed over the gate insulation film, and channels constituted by the Si thin film, contacts formed over the sources, the drains, and the gates, wires interconnecting the contacts, wherein the transistors have a common direction within a surface parallel to the substrate, and the common direction coincides with longitudinal directions of rectangular crystal grains of the Si thin film; and
surface roughness of the Si thin film or the sources or the drains, the gate insulation film, or the gates, which is a height difference between a top of a convex portion thereof and a bottom of a concave portion thereof, within the channels in the common direction differs from the surface roughness in a direction perpendicular to the common direction.
5. The thin film semiconductor device according to claim 4 , wherein a signal circuit formed by having at least one region comprising the plurality of transistors having the common direction and comprising a buffer circuit, a shift register circuit, a decoder circuit, a level conversion circuit, a driver circuit, or a digital-to-analog converter circuit is primarily integrated into a peripheral portion of the substrate, and a pixel driving circuit is formed on the identical substrate.
6. The thin film semiconductor device according to claim 4 , wherein a peripheral circuit unit or a pixel unit of an image display device has at least one region comprising a group of the aligned transistors; and
a longitudinal direction of the region coincides with a horizontal cutting plane line or a vertical cutting plane line for an edge of the substrate.