IP Library Granted Patent US 7,076,020
Granted Patent B2
US 7,076,020 · App. 10/451,247 · Granted Jul 11, 2006

Oxide phosphor and radiation detector using it, and X-ray CT device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,076,020
App. No.
10/451,247
Granted
Jul 11, 2006
Kind
B2
Abstract

An oxide phosphor includes an oxide consisting of at least Gd, Ce, Al, Ga, and O, and has the crystal structure of a garnet structure, the atomic ratio (Gd+Ce)/(Al+Ga+Gd+Ce) of which is more than 0.375 and 0.44 or less, and the atomic ratio Ce/(Ce+Gd) of which is 0.0005 or more and 0.02 or less. This oxide phosphor reduces composition misalignment occurring during sintering, being a drawback of a phosphor having (Gd 1-x Ce x ) 3 Al 5-y Ga y O 12 composition, and has a property of extremely small afterglow and high luminescence efficiency. By using this oxide phosphor as a scintillator of a radiation detector having a light detector, the radiation detector with low afterglow and high output can be obtained. Further, by applying this radiation detector to an X-ray CT apparatus, a tomogram with high resolution and high quality can be obtained.

Claims (41)

1. An oxide phosphor having the oxide consisting of at least Gd, Ce, Al, Ga, and O, wherein a crystal structure of said oxide is a garnet structure, the atomic ratio (Gd+Ce)/(Al+Ga+Gd+Ce) is more than 0.375 and 0.44 or less, and the atomic ratio Ce/(Ce+Gd) is no less than 0.0005 and no more than 0.02.

2. An oxide phosphor according to claim 1 , wherein the atomic ratio Ga/(Al+Ga) is more than 0 and less than 1.0.

3. An oxide phosphor according to claim 1 , further including an impurity phase of a perovskite structure.

4. An oxide phosphor according to claim 3 , wherein the intensity of a main diffraction line of the perovskite structure in an X-ray diffraction measurement is 50% or less with respect to the intensity of the main diffraction line of the garnet structure.

5. An oxide phosphor according to claim 1 , wherein oxide powder is synthesized by at least one of the following methods: an oxide-mixing method, a coprecipitation method, and a mechanically grinding method using material powder.

6. An oxide phosphor according to claim 5 , wherein the diameters of crystal grain of the oxide-synthesized powder are 1 μm or less.

7. An oxide phosphor according to claim 5 , wherein said oxide-synthesized powder is sintered by at least one of the following methods: a hot-press method, an HIP method, a pressureless sintering method, and simultaneous use of a pressureless sintering method and an HIP method.

8. An oxide phosphor according to claim 7 , wherein the relative density of the sintered body of the oxide-synthesized powder is 99.0% or more.

9. A scintillator including a sintered body of the oxide phosphor according to claim 1 .

10. A radiation detector in an X-ray detector including a ceramics scintillator and a light detector for detecting light emission of said scintillator, wherein the scintillator according to claim 9 is employed as said ceramics scintillator.

11. An X-ray CT apparatus comprising:

an X-ray source;

an X-ray detector located opposite to said X-ray source;

a rotating disk holding said X-ray source and said X-ray detector, which is driven to rotate around an object to be examined; and

an image reconstruction means for image-reconstructing a tomogram of said object on the basis of intensity of X-rays detected by said X-ray detector,

wherein a radiation detector according to claim 10 is employed as said X-ray detector.

12. An oxide phosphor having the oxide consisting essentially of Gd, Ce, Al, Ga, and O, wherein a crystal structure of said oxide is a garnet structure, the atomic ratio (Gd+Ce)/(Al+Ga+Gd+Ce) is more than 0.375 and 0.44 or less, and the atomic ratio Ce/(Ce+Gd) is no less than 0.0005 and no more than 0.02.

13. An oxide phosphor according to claim 12 , wherein the atomic ratio Ga/(Al+Ga) is more than 0 and less than 1.0.

14. An oxide phosphor according to claim 12 , further including an impurity phase of a perovskite structure.

15. An oxide phosphor according to claim 14 , wherein the intensity of a main diffraction line of the perovskite structure in an X-ray diffraction measurement is 50% or less with respect to the intensity of the main diffraction line of the garnet structure.

16. An oxide phosphor according to claim 12 , wherein oxide powder is synthesized by at least one of the following methods: an oxide-mixing method, a coprecipitation method, and a mechanically grinding method using material powder.

17. An oxide phosphor according to claim 16 , wherein the diameters of crystal grain of the oxide-synthesized powder are 1 μm or less.

18. An oxide phosphor according to claim 16 , wherein said oxide-synthesized powder is sintered by at least one of the following methods: a hot-press method, an HIP method, a pressureless sintering method, and simultaneous use of a pressureless sintering method and an HIP method.

19. An oxide phosphor according to claim 18 , wherein the relative density of the sintered body of the oxide-synthesized powder is 99.0% or more.

20. A scintillator including a sintered body of the oxide phosphor according to claim 12 .

21. A radiation detector in an X-ray detector including a ceramics scintillator and a light detector for detecting light emission of said scintillator, wherein the scintillator according to claim 20 is employed as said ceramics scintillator.

22. An X-ray CT apparatus comprising:

an X-ray source;

an X-ray detector located opposite to said X-ray source;

a rotating disk holding said X-ray source and said X-ray detector, which is driven to rotate around an object to be examined; and

an image reconstruction means for image-reconstructing a tomogram of said object on the basis of intensity of X-rays detected by said X-ray detector,

wherein a radiation detector according to claim 21 is employed as said X-ray detector.

23. An oxide phosphor according to claim 12 , wherein the oxide consists of Gd, Ce, Al, Ga and O.

24. A scintillator including a sintered body of the oxide phosphor according to claim 23 .

25. A radiation detector in an X-ray detector including a ceramics scintillator and a light detector for detecting light emission of said scintillator, wherein the scintillator according to claim 24 is employed as said ceramics scintillator.

26. An X-ray CT apparatus comprising:

an X-ray source;

an X-ray detector located opposite to said X-ray source;

a rotating disk holding said X-ray source and said X-ray detector, which is driven to rotate around an object to be examined; and

an image reconstruction means for image-reconstructing a tomogram of said object on the basis of intensity of X-rays detected by said X-ray detector,

wherein a radiation detector according to claim 25 is employed as said X-ray detector.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE THE PROPERTY AND APPLICATION NUMBERS PREVIOUSLY RECORDED AT REEL: 058026 FRAME: 0559. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jan 31, 2022
From: HITACHI LTD.
To: FUJIFILM HEALTHCARE CORPORATION
Reel/Frame 058917/0853 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 4, 2021
From: HITACHI, LTD.
To: FUJIFILM HEALTHCARE CORPORATION
Reel/Frame 058026/0559 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2016
From: HITACHI MEDICAL CORPORATION
To: HITACHI, LTD.
Reel/Frame 040545/0254 →