IP Library Granted Patent US 7,013,064
Granted Patent B2
US 7,013,064 · App. 10/463,478 · Granted Mar 14, 2006

Freespace tunable optoelectronic device and method

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Quick Facts
Patent No.
US 7,013,064
App. No.
10/463,478
Granted
Mar 14, 2006
Kind
B2
Abstract

A tunable optoelectronic device comprising: a resonant grating filter exhibiting at least one filtering characteristic as electromagnetic radiation impinges thereupon; at least one dielectric material coupling said radiation onto said resonant grating filter and movably positioned with respect to said filter so as to adjust the at least one filtering characteristic of said filter; and, at least one driving circuit for selectively positioning said at least one dielectric material so as to tune said at least one filtering characteristic.

Claims (22)

1. A tunable optoelectronic device being suitable for freespace operation comprising:

a resonant grating filter exhibiting at least one filtering characteristic as electromagnetic radiation impinges thereupon; and

at least one dielectric material coupling said radiation onto said resonant grating filter and movably positioned with respect to said filter so as to adjust the at least one filtering characteristic of said filter,

wherein said impinging electromagnetic radiation passes through said dielectric material prior to impinging upon said filter.

2. A tunable optoelectronic device being suitable for freespace operation comprising:

a resonant grating filter exhibiting at least one filtering characteristic as electromagnetic radiation impinges thereupon; and

at least one dielectric material coupling said radiation onto said resonant grating filter and movably positioned with respect to said filter so as to adjust the at least one filtering characteristic of said filter,

wherein said filter comprises an upper cladding layer, a core and a lower cladding layer.

3. The device of claim 2 , wherein said upper and lower cladding layers comprise SiO2 and said core comprises SiN.

4. The device of claim 3 , wherein said upper cladding layer has a thickness of approximately 0.1 micron, said core has a thickness of approximately 0.4 microns and said lower cladding layer has a thickness of approximately 1.5 microns.

5. The device of claim 3 , wherein said dielectric material comprises SiN.

6. The device of claim 5 , wherein said upper cladding layer has a thickness of approximately 1 micron, said core has a thickness of approximately 0.4 microns, said lower cladding layer has a thickness of approximately 1.5 microns and said dielectric material has a thickness of approximately 0.4 microns.

7. A tunable optoelectronic device being suitable for freespace operation comprising:

a resonant grating filter exhibiting at least one filtering characteristic as electromagnetic radiation impinges thereupon;

at least one dielectric material coupling said radiation onto said resonant grating filter and movably positioned with respect to said filter so as to adjust the at least one filtering characteristic of said filter; and

a semiconductor optical amplifier, wherein said dielectric material is optically interposed between said filter and amplifier in freespace.

8. The device of claim 7 , wherein said amplifier and filter define a cavity of an external cavity laser.

9. The device of claim 8 , further comprising at least one controller operatively coupled to at least said filter or dielectric material so as to adjust an operating wavelength of said external cavity laser by adjusting a distance between said dielectric material and filter.

10. The device of claim 7 , further comprising collimating optics optically interposed between said amplifier and filter.

11. The device of claim 7 , wherein said amplifier is a laser.

12. The device of claim 11 , wherein said laser is a type III–V semiconductor optical amplifier.

13. The device of claim 11 , wherein said laser is a Distributed Bragg Reflector laser.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Apr 20, 2018
From: BNP PARIBAS, AS COLLATERAL AGENT
To: API TECHNOLOGIES CORP.
Reel/Frame 045604/0054 →
SECURITY INTEREST Recorded Apr 22, 2016
From: API TECHNOLOGIES CORP.; SPECTRUM CONTROL, INC.; SPECTRUM MICROWAVE, INC.; API DEFENSE, INC.
To: BNP PARIBAS, AS COLLATERAL AGENT
Reel/Frame 038351/0207 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 29, 2013
From: NANTOPTICS LLC
To: API TECHNOLOGIES CORP.
Reel/Frame 030894/0291 →
CHANGE OF NAME Recorded Apr 29, 2013
From: ABRAXIS BIOSENSORS, LLC
To: NANTOPTICS, LLC
Reel/Frame 030312/0591 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 9, 2010
From: API NANOFABRICATION AND RESEARCH CORPORATION
To: ABRAXIS BIOSENSORS, LLC
Reel/Frame 024964/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 16, 2008
From: NANOOPTO CORPORATION
To: API NANOFABRICATION AND RESEARCH CORP.
Reel/Frame 021531/0594 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 25, 2007
From: NANOOPTO CORPORATION
To: API NANOFABRICATION AND RESEARCH CORPORATION
Reel/Frame 019617/0843 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2006
From: WANG, JIAN
To: NANOOPTO CORPORATION
Reel/Frame 017488/0072 →