Method and system for visualizing surface errors
A method and system for visualizing deviations on an actual surface 10, 30 from a nominal, or designed, surface 28 utilizes a system and method for mapping the spatial (e.g. x, y and z) coordinates of the actual surface 10, 30 into a computer 13 , comparing the mapped actual surface to the nominal surface 28 to produce a three-dimensional distribution of deviation values (D), processing this distribution into a topographical pattern 34 of multiple contours or areas 34 a . . . 34 n , each contour or area having the same, or generally the same, deviation value (D), and optically projecting this topographical pattern 34 onto the actual surface 10, 30 in registry with the initial surface mapping to provide a display of the surface deviations (D) directly on the actual surface 10, 30 . The deviations are measured along a direction D normal to the actual surface so that the three-dimensional distribution is given in x, y, D coordinates. The optical projection is preferably a laser projection 38 . The mapping and projection onto the actual surface 10, 30 are made, and coordinated with one another, with respect to three reference points 32 on the surface 10, 30.
1. A method for visualizing deviations on an actual surface from a nominal surface comprising the steps of:
a. mapping the spatial coordinates of an actual surface,
b. comparing said mapped spatial coordinates to the nominal surface to produce a three-dimensional distribution of values for deviations D of the actual surface from the nominal surface,
c. generating from said distributions a topographical pattern of deviations having generally the same deviation value D, and
d. optically laser projecting that topographical pattern onto the actual surface to visualize said deviations D, where said optical laser projecting is made with reference to at least three fixed reference points on said actual surface.
2. The method of claim 1 wherein said deviations D are measured along a normal to the actual surface.
3. The method of claim 1 wherein said topographical pattern constitutes plural contours each including deviation values falling within a range of a different selected values of D.
4. The method of claim 1 wherein said mapping is made with reference to at least three fixed reference point on said actual surface.
5. The method of claim 1 wherein said generating comprises processing said distribution of sampled spatial coordinate data into a surface of points representative of the actual surface.
6. The method of claim 1 wherein said mapping comprises optical tracking.
7. The method of claim 2 , 3 , or 5 wherein said processor establishes a mesh grid of a preselected grid spacing and conforms said spatial coordinate data and said nominal data to said mesh grid.
8. The method of claim 3 wherein said generating also produces a gradient value and direction of increasing gradient between said contours, and said optically projecting includes a projection of a graphical representation of said gradient associated with said contours.
9. Apparatus for visualizing deviations in an actual surface from a nominal surface comprising:
a. a surface profiler that maps the spatial coordinates of an actual surface,
b. a processor that
i) compares said mapped spatial coordinates to the nominal surface to produce a three-dimensional distribution of values for deviations D of the actual surface from the nominal surface, and
ii) generates from said distributions a topographical pattern of deviation having generally the same deviation value D, and
c. an optical laser projector that projects a topographical pattern onto the actual surface to visualize said deviations D.
10. The apparatus of claim 9 wherein said processor computes said deviation D along a normal to the actual surface.
11. The apparatus of claim 10 wherein said topographical pattern constitutes plural contours each including deviation values falling within a range of a different selected values of D.
12. The apparatus of any of claims 9 - 11 wherein said actual surface has at least three reference points and said profiler and said optical projector operate with reference to said at least three fixed reference points.
13. The apparatus of claim 12 wherein said processor also generates a gradient associated with said contours and said optical projector projects a visual display of said gradients.
14. The apparatus of claim 12 wherein said surface profiler is an optical tracker.
15. The apparatus of claim 12 wherein said processor establishes a mesh grid of preselected grid spacing and conforms said spatial coordinates and said actual normal surface to said grid.