Calibration of infra red cameras
View Patent ↗A reference surface for calibrating cooled infra red detectors includes a plurality of corner cube units which reflect radiation incident directly on them. The surface of each corner cube unit is partially reflective and partially emissive such that, when imaged by a cryogenically cooled detector, the reference surface appears as a black body source at a lower temperature than the actual temperature thereof.
1. A calibration system for an infrared detector comprising a plurality of detector elements, said calibration system comprising:
a reference surface which includes a plurality of concave corner cubes that are partially reflective and partially emissive;
temperature controlling means adapted to maintain the reference surface at a desired calibration temperature; and
processing means for receiving an output signal generated by an infrared detector at said the desired calibration temperature, comparing said detector output signal for each element of said detector with a predetermined ideal output signal for said desired calibration temperature and calculating a calibration coefficient based on the difference between the detector output signal and the ideal output signal at said desired calibration temperature.
2. An infrared detector calibration system according to claim 1 wherein the emissivity of the reference surface is controlled by controlling the temperature of said reference surface.
3. An infrared detector calibration system, according to claim 1 , wherein each corner cube comprises a reflective surface and a matt surface to form an effective surface having a predetermined desired emissivity.
4. An infrared detector calibration system according to claim 3 , wherein the reflective surface comprises a silvered surface.
5. An infrared detector calibration system according to claim 3 , wherein the reflective surface comprises an aluminized surface.
6. An infrared detector calibration system according to claim 3 , wherein the matt surface comprises a matt black paint overlying the reflective surface.
7. An infrared detector calibration system according to claim 3 , wherein the matt surface comprises a non-reflective surface etched into the reflective surface.
8. A method of calibrating an infrared detector comprising a plurality of detector elements using a reference surface that is characterized by partial emissivity and partial reflectivity, the method comprising:
a) presenting the reference surface at a known temperature to an infrared detector;
b) measuring the output of each detector element;
c) comparing the measured output of each detector element with a nominal output for the known reference surface temperature to determine a calibration error at the known temperature; and
d) heating the reference surface to one or more further known temperatures and repeating steps b) and c) to determine a calibration error for each of the further known temperatures.
9. The method according to claim 8 , further comprising the step of calculating a function relating the output error of each detector element to the temperature of the reference surface.
10. The method according to claim 9 , wherein the function is a polynominal function.
11. The method according to claim 8 , further comprising the step of storing the calibration constants for application to readings obtained from the detector.