Method for selectively covering a micro machined surface
View Patent ↗On a die that has etchings on a surface, firstly a sheet of negative photoresist is laid down which, by means of an exposure and subsequent development, is left only above the etchings; then, upon the negative photoresist, a positive photoresist is applied, which is subjected to exposure and development to produce functional geometries deposited in thin film; subsequently the positive photoresist is removed in a “lift-off” operation, and the negative photoresist is taken off in a plasma operation, thus revealing the etchings.
1. A method for selectively covering a micro machined surface on a die comprising an upper face and at least one etched recess located in the upper face, the method comprising:
applying a film of negative photoresist onto the upper face, the film of negative photoresist covering the at least one etched recess without filling the at least one etched recess;
exposing the film of negative photoresist to ultraviolet radiation through a first mask, the first mask having a window coextensive with at least the at least one etched recess, thereby polymerizing a region of the film of negative photoresist covering the at least one etched recess;
removing a non-polymerized portion of the film of negative photoresist from the upper face, thereby leaving a covering of polymerized film over the at least one etched recess;
applying a layer of lift off resist over the upper face of the die and over the covering; and
applying a layer of positive photoresist over the layer of lift off resist.
2. The method according to claim 1 , further comprising:
exposing a portion of the layer of positive photoresist to ultraviolet radiation through a window in a second mask to depolymerize the portion of the layer of positive photoresist; and
removing the depolymerized portion of the layer of positive photoresist, thereby forming at least one cavity.
3. The method according to claim 2 , further comprising:
applying a first deposited layer on said upper face of said die;
applying a further deposited layer on an upper surface of the layer of positive photoresist;
removing the layer of positive photoresist and the layer of lift off resist using a solvent that acts through side edges and sub-etchings of the at least one cavity;
casting aside the further deposited layer; and
removing the film of negative photoresist.
4. The method according to claim 1 , wherein the first deposited layer and said further deposited layer are metallic.
5. The method according to claim 4 , wherein the first deposited layer and said further deposited layer include at least one layer of gold or of titanium or of platinum.
6. The method according to claim 4 , wherein the first deposited layer and said further deposited layer include at least one layer of gold/tin alloy.
7. The method according to claim 1 , wherein the further deposited layer and said first deposited layer comprise non metallic material.
8. The method according to claim 7 , wherein the nonmetallic materials comprise an oxide.
9. The method according to claim 7 , wherein the nonmetallic materials comprise a carbide.
10. The method according to claim 7 , wherein the nonmetallic materials comprise a nitride.
11. A method for selectively covering a micro machined surface on a die comprising an upper face and at least one etched recess located in the upper face, the method comprising:
applying a film of negative photoresist onto the upper face, the film of negative photoresist covering the at least one etched recess without filling the at least one etched recess;
exposing the film of negative photoresist to ultraviolet radiation through a first mask, the first mask having a window coextensive with at least the at least one etched recess, thereby polymerizing a region of the film of negative photoresist covering the at least one etched recess;
removing a non-polymerized portion of the film of negative photoresist from the upper face, thereby leaving a covering of polymerized film over the at least one etched recess; and
applying a layer of positive photoresist over the upper face of the die and over the covering.
12. The method according to claim 11 , further comprising:
exposing a portion of the layer of positive photoresist to ultraviolet radiation through a window in a second mask to depolymerize the portion of the layer of positive photoresist; and
removing the depolymerized portion of the layer of positive photoresist, thereby forming at least one cavity.
13. The method according to claim 12 , further comprising:
applying a first deposited layer on said upper face of said die;
applying a further deposited layer on an upper surface of the layer of positive photoresist;
removing the layer of positive photoresist using a solvent that acts through walls of the at least one cavity;
casting aside the further deposited layer; and
removing the film of negative photoresist.
14. The method according to claim 13 , wherein the first deposited layer and said further deposited layer are metallic.
15. The method according to claim 14 , wherein the first deposited layer and said further deposited layer comprise at least one layer of gold or of titanium or of platinum.
16. The method according to claim 14 , wherein the first deposited layer and said further deposited layer comprise at least one layer of gold/tin alloy.
17. The method according to claim 13 , wherein the first deposited layer and said further deposited layer are made of nonmetallic materials.
18. The method according to claim 17 , wherein the nonmetallic materials comprise an oxide.
19. The method according to claim 17 , wherein the nonmetallic materials comprise a carbide.
20. The method according to claim 17 , wherein the nonmetallic materials comprise a nitride.