IP Library Granted Patent US 7,525,512
Granted Patent B2
US 7,525,512 · App. 10/542,612 · Granted Apr 28, 2009

Testing and inspecting method of a plasma display panel

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Quick Facts
Patent No.
US 7,525,512
App. No.
10/542,612
Granted
Apr 28, 2009
Kind
B2
Abstract

An improved method of testing and inspecting a plasma display panel. In a plasma display panel, a plurality of cells are formed at an intersection of each electrode disposed in a row direction and in a column direction of the panel. A field is formed of a plurality of sub-fields, and the combination of the sub-fields enables the panel to have a gradation display. In the inspection method, an address pulse voltage is not applied to a target cell to be inspected in a predetermined sub-field, but is applied to at least one cell of the cells adjacent to the target cell, and the address pulse voltage is applied to the target cell in the successive sub-field. If the barrier ribs of the target cell have an imperfection, wall charges of the cell are affected by the discharge occurred in an adjacent cell, and the target cell fails to light on in the successive sub-field. The inspection method can thus detect lighting failure caused by defective barrier ribs.

Claims (8)

1. A method of testing and inspecting a plasma display panel in which a plurality of cells are formed at an intersection of each electrode disposed in a row direction and in a column direction, comprising:

forming a field from a plurality of sub-fields, each subfield having an initializing period for producing an initial discharge, an address period for producing an address discharge with application of an address pulse voltage, and a discharge sustain period for producing a sustain discharge, and

obtaining a gradation display using a combination of the plurality of sub-fields that are responsible for turning on the plurality of cells,

wherein, the address pulse voltage is not applied to a target cell in a predetermined sub-field to be tested and inspected, but is applied to at least one specific cell of adjacent cells positioned adjacent to the target cell, and the address pulse voltage is applied to the target cell in a successive sub-field, and it is judged whether the target cell in the successive sub-field is on or not.

2. The method of testing and inspecting a plasma display panel of claim 1 , wherein the specific cell is adjacent to the target cell in a row direction.

3. The method of testing and inspecting a plasma display panel of claim 1 , wherein the specific cell is adjacent to the target cell in a column direction.

4. The method of testing and inspecting a plasma display panel of claim 1 , wherein the specific cell is adjacent to the target cell in a diagonal direction.

5. The method of testing and inspecting a plasma display panel of claim 1 , wherein the specific cell is adjacent to the target cell in at least two of a row direction, a column direction, and a diagonal direction.

Assignments (2)
CHANGE OF NAME Recorded Oct 27, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021738/0878 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2006
From: IKURA, TSUNEO; WAKITANI, TAKAO
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 017455/0460 →