IP Library Granted Patent US 7,883,998
Granted Patent B2
US 7,883,998 · App. 10/589,733 · Granted Feb 8, 2011

Vapor phase growth method

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Quick Facts
Patent No.
US 7,883,998
App. No.
10/589,733
Granted
Feb 8, 2011
Kind
B2
Abstract

It is to provide a vapor phase growth method in which an epitaxial layer consisting of a compound semiconductor such as InAlAs, can be grown, with superior reproducibility, on a semiconductor substrate such as Fe-doped InP. In vapor phase growth method for growing an epitaxial layer on a semiconductor substrate, a resistivity of the semiconductor substrate at a room temperature is previously measured, a set temperature of the substrate is controlled depending on the resistivity at the room temperature such that a surface temperature of the substrate is a desired temperature regardless of the resistivity of the semiconductor substrate, and the epitaxial layer is grown.

Claims (9)

1. A reproducible vapor phase growth method for growing an epitaxial layer on semiconductor substrates of a single crystal, comprising:

measuring a resistivity of arbitrary semiconductor substrates at a room temperature;

obtaining respectively a relationship between a heating temperature and a temperature of a surface of the arbitrary semiconductor substrates, for the arbitrary semiconductor substrates having different resistivities, the relationship depending on different cutting positions of the single crystal;

setting and adjusting said heating temperature of a semiconductor substrate to be used based on (i) a measured resistivity of the semiconductor substrate to be used and (ii) the obtained relationship between the heating temperature and the temperature of the surface of said semiconductor substrate; and

growing the epitaxial layer, wherein the temperature of said surface of said semiconductor substrate to be used is indirectly controlled by adjusting said heating temperature.

2. The vapor phase growth method as claimed in claim 1 , wherein the semiconductor substrate is a compound semiconductor.

3. The vapor phase growth method as claimed in claim 2 , wherein the semiconductor substrate is an InP substrate.

4. The vapor phase growth method as claimed in claim 3 , wherein the semiconductor substrate is an Fe-doped InP substrate.

5. The vapor phase growth method as claimed in any of claims 1 to 4 , wherein a molecular beam epitaxy is used to grow an epitaxial layer.

Assignments (5)
CHANGE OF ADDRESS OF ASSIGNEE Recorded Jun 2, 2017
From: JX NIPPON MINING & METALS CORPORATION
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 042669/0315 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS PREVIOUSLY RECORDED AT REEL: 031781 FRAME: 0424. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded May 22, 2014
From: NIPPON MINING HOLDINGS, INC.
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 033003/0896 →
CHANGE OF NAME Recorded Dec 13, 2013
From: NIPPON MINING HOLDINGS, INC
To: JX NIPPON MINING & METALS CORPORATION
Reel/Frame 031781/0424 →
MERGER Recorded Dec 11, 2013
From: NIPPON MINING & METALS CO. LTD
To: NIPPON MINING HOLDINGS, INC.
Reel/Frame 031757/0539 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 26, 2007
From: NAKAMURA, MASASHI; OOTA, SUGURU; HIRANO, RYUICHI
To: NIPPON MINING & METALS CO., LTD.
Reel/Frame 019061/0036 →