IP Library Granted Patent US 7,639,319
Granted Patent B2
US 7,639,319 · App. 10/593,110 · Granted Dec 29, 2009

Polymer dispersed liquid crystal formulations for modulator fabrication

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,639,319
App. No.
10/593,110
Granted
Dec 29, 2009
Kind
B2
Abstract

Embodiments of polymer dispersed liquid crystals (PDLCs) in accordance with the present invention comprise TL-series liquid crystal materials and a polymer matrix comprising polyacrylate resins having hydroxyl groups. These hydroxyl groups allow crosslinking by using isocyanate, improving mechanical properties and heat resistance. Typical ratios of liquid crystal to polymer range between about 50/50 to 70/30 (wt/wt). The PDLC materials exhibit enhanced sensitivity to driving voltages and higher transmission˜voltage (T-V) curve slope. In testing thin film transistors (TFTs), these PDLC materials can be used to compensate for an increased air gap accommodating flatness variation in the TFT substrate, and to reduce electrostatic forces between modulator and panel. Embodiments of PDLC materials in accordance with the present invention form solid films upon evaporation of the solvent. Homogeneity of embodiments of solvent-based PDLC formulations in accordance with the present invention allow for the use of many different coating methods, such as spin, doctor blade, and slot-die coatings.

Claims (22)

1. A method of detecting defective operation of an electro-optical device, the method comprising:

disposing a polymer dispersed liquid crystal (PDLC) overlying and separated from an underlying electro-optical device by an air gap, the PDLC having a polymer matrix formed by the cross-linking of a polyacrylate resin and a polyisocyanate resin, and having a liquid crystal exhibiting a minimum bulk resistivity of 1×10 12 ohm·cm and a voltage holding ratio (VHR) of 98% or greater;

applying a voltage to a transparent electrode overlying the PDLC while illuminating the PDLC; and

detecting a changed intensity of light transmitted by the PDLC.

2. The method of claim 1 wherein the PDLC is disposed over a glass substrate bearing a thin film transistor.

3. The method of claim 1 wherein the changed intensity of light is detected by reflection of the incident light by a mirror.

4. The method of claim 1 wherein the PDLC comprises a ratio of liquid crystal to polymer of between about 50/50 and 70/30 (wt/wt).

5. The method of claim 1 wherein the applied voltage is between about 100-320 V across an air gap of at least 5 μm.

6. The method of claim 1 wherein the polyacrylate resin is selected from the group consisting of Paraloid AU1033 available from Rohm and Haas, and Doresco TA45-8or Doresco TA65-1 available from Dock Resins.

7. The method of claim 1 wherein the polyisocyanate resin comprises an aliphatic polyisocyanate such as Desmodur N-75 from Bayer Polymers.

8. The method of claim 1 wherein the liquid crystal is selected from the TL series available from EM Industries.

9. An apparatus for inspecting a semiconductor device, the apparatus comprising:

a support for a semiconductor device;

an electro-optic modulator separated from the support by an air gap, the electro-optic modulator comprising,

a mirror disposed proximate to the support,

a transparent electrode distal from the support, and

a polymer dispersed liquid crystal (PDLC) sensor material disposed between the transparent electrode and the mirror, the PDLC having a polymer matrix formed by the cross-linking of a polyacrylate resin and a polyisocyanate resin, and a liquid crystal exhibiting a minimum bulk resistivity of 1×10 12 ohm·cm and a voltage holding ratio (VHR) of 98% or greater;

a light source configured to illuminate the PDLC material during application of a voltage to the transparent electrode; and

a detector configured to detect intensity of light reflected by the mirror.

10. The apparatus of claim 9 wherein the support comprises a support for a workpiece bearing a thin film transistor.

11. The apparatus of claim 9 wherein the air gap has a width of between about 5-30 μm, and a voltage of about 100-320 V is configured to be applied to the transparent electrode.

12. The apparatus of claim 9 wherein the liquid crystal is selected from the TL series available from EM Industries.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2021
From: PHOTON DYNAMICS, INC.
To: ORBOTECH LTD.
Reel/Frame 055831/0793 →
RELEASE OF SECURITY INTEREST Recorded Jul 5, 2016
From: JPMORGAN CHASE BANK, N.A.
To: PHOTON DYNAMICS, INC.
Reel/Frame 039076/0165 →
SECURITY INTEREST Recorded Aug 14, 2014
From: PHOTON DYNAMICS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 033543/0631 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 14, 2006
From: CHEN, XIANHAI
To: PHOTON DYNAMICS, INC.
Reel/Frame 018339/0102 →