Method for microscopy, and microscope
View Patent ↗The invention discloses a method for microscopy in which a specimen is illuminated with pulsed illuminating light that comprises light from a spectral region, and detection light proceeding from the specimen is detected in a detection spectral region. The method is characterized in that the detection spectral region lies within the spectral region, and that the illuminating light contains no light from the detection spectral region or at least none having the same polarization properties. A microscope is additionally disclosed.
1. A method for microscopy comprising the steps of:
generating pulsed illuminating light that comprises wavelengths which lie in a spectral region;
defining a detection spectral region that lies within the spectral region;
influencing the light components of the illuminating light that comprise wavelengths within the detection spectral region by removing the light components using a spectral filter so as to provide influenced illuminating light;
illuminating a specimen with the influenced illuminating light;
detecting the detection light proceeding from the specimen within the detection spectral region; and
allowing, using a further spectral filter, only light of the wavelengths of the detection spectral region to arrive at the detector, the further spectral filter being inverse with respect to the spectral filter.
2. The method as defined in claim 1 , wherein the influencing includes a modification of the polarization state of the light components of the illuminating light that comprise wavelengths within the detection spectral region.
3. The method as defined in claim 2 , wherein the modification of the polarization state encompasses a rotation of a linear polarization.
4. The method as defined in claim 1 , wherein a pulsed laser is provided for generating the pulsed illuminating light.
5. A microscope having a light source for generating pulsed illuminating light that comprises light from a spectral region, and having at least one detector for detecting the detection light proceeding from a specimen in a detection spectral region, wherein the detection spectral region lies within the spectral region;
further comprising a spectral filter that removes, from the illuminating light, light components of the illuminating light that comprise wavelengths within the detection spectral region, and further comprising a further spectral filter that allows only light of the wavelengths of the detection spectral region to arrive at the detector, wherein the further spectral filter is inverse with respect to the spectral filter.
6. The microscope as defined in claim 5 , further comprising a third spectral filter that modifies the polarization state of the light components of the illuminating light that comprise wavelengths within the detection spectral region.
7. A confocal scanning microscope having a light source for generating pulsed illuminating light that comprises light from a spectral region, and having at least one detector for detecting the detection light proceeding from a specimen in a detection spectral region, wherein the detection spectral region lies within the spectral region;
further comprising a spectral filter that removes, from the illuminating light, light components of the illuminating light that comprise wavelengths within the detection spectral region, and further comprising a further spectral filter that allows only light of the wavelengths of the detection spectral region to arrive at the detector, wherein the further spectral filter is inverse with respect to the spectral filter.
8. The confocal scanning microscope as defined in claim 7 , further comprising a third spectral filter that modifies the polarization state of the light components of the illuminating light that comprise wavelengths within the detection spectral region.