Integrated circuit fuse and method of opening
View Patent ↗An integrated circuit, a fuse therefor and fuse opening method are disclosed. The method implements fuse opening using a wet etchant. As a result, there is no explosion that causes damage to surrounding material. In addition, use of the wet etchant allows positioning of a fuse in any metal layer including any non-last metal layer, thus increasing design possibilities.
1. A method for opening an integrated circuit fuse, the method comprising the steps of:
generating at least one opening to a fuse element that couples a plurality of terminals and is located in a non-last metal layer; and
wet etching die fuse element to open the fuse.
2. The method of claim 1 , wherein the generating step includes:
applying a photoresist to define an opening area for each opening; and
etching to generate the at least one opening.
3. The method of claim 2 , wherein the applying step includes:
depositing the photoresist;
exposing the photoresist using laser light; and
developing the photoresist to define the opening area for each opening.
4. The method of claim 3 , wherein the generating step further includes removing the photoresist and a diffusion baffler on the fuse element.
5. The method of claim 1 , wherein the generating step includes applying a polymer and ablating the polymer with a laser to define the at least one opening.
6. The method of claim. 1 , wherein the at least one opening includes one opening to each side of the plurality of terminals.
7. The method of claim 6 , wherein the wet etching step removes the fuse element under the plurality of terminals.
8. The method of claim 1 , wherein each terminal is fully-landed on a wire of the fine element and includes a metal liner surrounding the terminal.
9. The method of claim 1 , wherein the fuse element and each terminal include copper.
10. The method of claim 1 , wherein the wet etchant includes at least one of sulfuric acid, aqueous ammonium persulfate, hydrogen peroxide and water.