IP Library Granted Patent US 6,889,553
Granted Patent B2
US 6,889,553 · App. 10/604,386 · Granted May 10, 2005

Method and apparatus for vibration sensing and analysis

Assignee: PCB Piezotronics Inc.
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Quick Facts
Patent No.
US 6,889,553
App. No.
10/604,386
Granted
May 10, 2005
Kind
B2
Abstract

A method and apparatus for sensing and measuring stress waves. The method comprises the steps of: a.) sensing motion, where the motion comprises a stress wave component and a vibration component; b.) separating the stress wave component from the vibration component with a high pass filter to create a signal proportional to the stress wave; c.) amplifying the signal to create an amplified signal; d.) processing the amplified signal with a sample and hold peak detector over a predetermined interval of time to determine peaks of the amplified signal over said predetermined period of time; e.) creating an output signal proportional to the determined peaks of the amplified signal; and, f.) repeating steps d.) and e.). The invention also includes an apparatus for implementing the method of the invention.

Claims (25)

1. A method for sensing and measuring stress waves, comprising:

a.) sensing motion, where said motion comprises a stress wave component and a vibration component;

b.) separating said stress wave component from said vibration component with a high pass filter to create a signal proportional to said stress wave;

c.) amplifying said signal to create an amplified signal;

d.) processing said amplified signal with a sample and hold peak detector over a predetermined interval of time to determine peaks of said amplified signal over said predetermined period of time;

e.) creating an output signal proportional to said determined peaks of said amplified signal; and,

f.) repeating steps d.) and e.).

2. The method recited in claim 1 , further comprising the step of averaging said peaks of said amplified signal.

3. The method recited in claim 1 wherein said high pass filter is selectable about a plurality of frequencies.

4. The method recited in claim 2 wherein said high pass filter is selectable about 1 KHz and 5 KHz.

5. The method of claim 1 wherein said amplifying is done with a logarithmic amplifier.

6. The method of claim 1 wherein said sensing is done with an accelerometer.

7. The method of claim 1 wherein said sensing is done with a strain gauge.

8. An apparatus for sensing and measuring stress waves, comprising:

a.) means for sensing motion, where said motion comprises a stress wave component and a vibration component;

b.) means for separating said stress wave component from said vibration component to create a signal proportional to said stress wave;

c.) means for amplifying said signal to create an amplified signal;

d.) means for processing said amplified signal with a sample and hold peak detector over a predetermined interval of time to determine peaks of said amplified signal over said predetermined period of time;

e.) means for creating an output signal proportional to said determined peaks of said amplified signal; and,

f.) means for repeating steps d.) and e.).

9. The apparatus recited in claim 8 wherein said means for sensing is an accelerometer.

10. The apparatus recited in claim 8 wherein said means for sensing is a strain gauge.

11. The apparatus recited in claim 8 wherein said means for separating said stress wave component from said vibration component to create a signal proportional to said stress wave is a high pass filter.

12. The apparatus recited in claim 11 wherein said means for separating said stress wave from said vibration component to create a signal proportional to said stress wave comprises a selectable dual frequency high-pass filter, selectable to pass signals above at least two different frequencies.

13. The apparatus recited in claim 12 wherein said high-pass filter is selectable about 1 KHz or 5 KHz.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 1, 2015
From: CSI TECHNOLOGY, INC.
To: COMPUTATIONAL SYSTEMS, INC.
Reel/Frame 034610/0318 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2006
From: PCB PIEZOTRONICS, INC.
To: CSI TECHNOLOGY, INC.
Reel/Frame 017448/0024 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 16, 2003
From: ROBINSON, JAMES C.; FULCINITI, NICOLAS; ILLIG, MITCHELL J.; ASHTON, WILLIAM J.
To: PCB PIEZOTRONICS INC., IMI SENSORS
Reel/Frame 014199/0871 →
Continuity (1)
Related Publication 20050011266A1 · Jan 20, 2005