IP Library Granted Patent US 6,944,552
Granted Patent B2
US 6,944,552 · App. 10/606,134 · Granted Sep 13, 2005

System and method for detecting power deficiencies in a computer component

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Quick Facts
Patent No.
US 6,944,552
App. No.
10/606,134
Granted
Sep 13, 2005
Kind
B2
Abstract

One embodiment of the invention is a method for analyzing power in a component comprising determining a plurality of current densities, wherein each current density is associated with one portion of a plurality of portions of the component, determining a plurality of wire densities, wherein each wire density is associated with one region of a plurality of regions of the component, and comparing the plurality of current densities and the plurality of wire densities.

Claims (56)

1. A method for analyzing power in a component comprising:

determining a plurality of current densities, wherein each current density is associated with one portion of a plurality of portions of the component;

determining a plurality of wire densities, wherein each wire density is associated with one region of a plurality of regions of the component; and

comparing the plurality of current densities and the plurality of wire densities.

2. The method of claim 1 , further comprising:

determining a ratio of the plurality of current densities and the plurality of wire densities; and

identifying any geometric coordinates whereby the ratio exceeds a predetermined number.

3. The method of claim 1 , further comprising:

selecting the component from the group consisting of:

a processor, a memory chip, a memory controller chip, a chipset component, a communications chip, a graphics chip, a VLSI component, and a computer component.

4. The method of claim 1 , further comprising:

forming a plot of a ratio of the plurality of current densities and the plurality of wire densities.

5. The method of claim 4 , further comprising:

associating the plot with a portion of a design of the component.

6. The method of claim 1 , wherein determining the plurality of current densities comprises:

determining a respective current consumption value for a plurality of elements within the one portion of the component; and

mapping the plurality of current consumption values to geometric coordinates for a design of the component.

7. The method of claim 6 , wherein the step of determining a respective current consumption value comprises:

calculating CVf(A f );

wherein C is a capacitance of the element, V is a voltage of the element, f is the clock frequency of the element, and A f is the activity factor of the element.

8. The method of claim 6 , wherein the plurality of elements are field effect transistors.

9. The method of claim 6 , wherein the elements are connected to a power wire.

10. The method of claim 6 , wherein mapping the plurality of current consumption values comprises:

translating the geometric coordinates to a level of the design that corresponds to a level of analysis for the analyzing power in the component.

11. The method of claim 1 , wherein determining a plurality of wire densities comprises:

repeating a window across a portion of the design of the component;

determining a density of power wires within each window; and

mapping the plurality of power wire densities to geometric coordinates for the design of the component.

12. The method of claim 11 , wherein determining a plurality of wire densities further comprises:

selecting a size of the analysis window.

13. The method of claim 12 , wherein the design is a hierarchical design that has a plurality of hierarchical levels, the method further comprises:

increasing the size of the window as a level of interest of the hierarchical design is increased.

14. The method of claim 11 , wherein mapping the plurality of current consumption values comprises:

translating the geometric coordinates to a level of the design that corresponds to a level of analysis for the analyzing power in the component.

15. The method of claim 11 , further comprising:

overlapping the windows to form average values for the wire densities.

16. The method of claim 1 , wherein the design has a plurality of power wire levels, and determining a plurality of wire densities further comprises:

summing the plurality of power wire levels to a single level.

17. The method of claim 1 , wherein the design has a plurality of power wire levels, and determining a plurality of wire densities further comprises:

determining a plurality of wire densities for each level of the design; and

comparing the plurality of current densities and the plurality of wire densities for each level of the design.

18. The method of claim 1 , wherein the design is a hierarchical design that has a plurality of hierarchical levels, the method further comprises:

flattening the hierarchical design into a single level.

19. The method of claim 1 , wherein determining a plurality of wire densities comprises:

(a) sliding a window across a portion of a region of the design of the component;

(b) determining a density of power wires within each window;

repeating (a) and (b) for the region of the design; and

mapping the plurality of power wire densities to geometric coordinates for the design of the component.

20. A system for current management comprising:

means for determining a plurality of current densities of a component;

means for determining a plurality of wire densities of the component; and

means for forming a comparison of the plurality of current densities and the plurality of wire densities.

21. A computer program product for current management having a computer readable medium, the product comprising:

code, that is stored on the computer readable medium, for determining a plurality of current densities of a component;

code, that is stored on the computer readable medium, for determining a plurality of wire densities of the component; and

code, that is stored on the computer readable medium, for forming a representation of the plurality of current densities and the plurality of wire densities that is viewable by a user.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 26, 2021
From: OT PATENT ESCROW, LLC
To: VALTRUS INNOVATIONS LIMITED
Reel/Frame 057650/0537 →
PATENT ASSIGNMENT, SECURITY INTEREST, AND LIEN AGREEMENT Recorded Jan 26, 2021
From: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP; HEWLETT PACKARD ENTERPRISE COMPANY
To: OT PATENT ESCROW, LLC
Reel/Frame 055269/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2015
From: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
To: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Reel/Frame 037079/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2003
From: FRANCOM, ERIN; ROGERS, GREGORY D.
To: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
Reel/Frame 013995/0564 →