Method and construct for enabling programmable, integrated system margin testing
View Patent ↗The present invention provides a margin testing system, incorporated in an electronic system (e.g., a computer system), that includes a controller, a frequency control module, and a voltage control module, and a fault bypass module. In response to commands from the controller, the frequency control module and/or the voltage control module can set a test clock frequency and/or a test voltage for application to one or more components of the electronic system to elicit system response to these test values. The response of the system at each test value can be monitored, e.g., by executing a diagnostics software, and analyzed. The fault bypass module can mask fault signals during margin testing to ensure that these signals will not disrupt margin testing of the system.
1. An electronic system comprising:
a host controller configured to execute an operating system and one or more management agents;
a plurality of components configured to provide functionality for the electronic system; and
a margin testing system integrated with said host controller and said plurality of components, said testing system configured for margin testing one or more of said plurality of components, said margin testing system comprising:
a baseboard management controller (BMC) configured to communicate with said host controller; and
a digital parameter adjuster configured to communicate with said BMC and configured to set at least one operating parameter associated with at least one of said plurality of components to one or more test values in response to commands from said BMC,
wherein said BMC is configured to monitor a response of the electronic system to said one or more test values.
2. The electronic system of claim 1 , further comprising:
a hardware monitor configured to communicate with said BMC and at least one of said plurality of components to receive information from said at least one of said plurality of components in response to said one or more test values and to transmit said received information to said BMC.
3. The electronic system of claim 2 , further comprising:
at least one communications bus configured to couple said BMC to said parameter adjuster and said hardware monitor.
4. The electronic system of claim 1 , further comprising:
a diagnostics software configured to collect data regarding said response of the electronic system to said one or more test values.
5. The electronic system of claim 4 , wherein said BMC is configured to execute said diagnostics software.
6. The electronic system of claim 1 , wherein said BMC is further configured to transmit one or more command signals to said parameter adjuster to effect variation of said at least one operating parameter.
7. The electronic system of claim 1 , wherein said at least one operating parameter comprises a frequency at which a clock signal is applied to said at least one of said plurality of components.
8. The electronic system of claim 1 , wherein said BMC is configured to implement management of said plurality of components of the electronic system.
9. The electronic system of claim 1 , wherein said BMC is configured to implement Intelligent Platform Management Interface (IPMI) protocol.
10. The electronic system of claim 1 , further comprising:
an Inter-Integrated Circuit-based bus configured to provide communication between said BMC and said parameter adjuster.
11. The electronic system of claim 10 , wherein said Inter-Integrated Circuit-based bus comprises an Intelligent Platform Management Bus (IPMB).
12. The electronic system of claim 1 , wherein said parameter adjuster comprises a digital programmable frequency synthesizer.
13. The electronic system of claim 12 , wherein said frequency synthesizer is configured to receive an input reference clock signal and, in response to a command signal from said BMC, generates an output clock signal as a multiple of said input clock signal.
14. The electronic system of claim 13 , wherein said frequency synthesizer is configured to apply said output clock signal to one or more of said plurality of components for testing thereof.
15. The electronic system of claim 1 , wherein the electronic system comprises a computer system.
16. The electronic system of claim 15 , wherein said computer system comprises a computer server.