IP Library › Granted Patent US 6,832,508
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US 6,832,508 · Confirmation No. 6513

ATOMIC FORCE MICROSCOPY MEASUREMENTS OF CONTACT RESISTANCE AND CURRENT-DEPENDENT STICTION

Inventor: Shiva Prakash
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2004-12-01 BIB Bibliographic Data Sheet 1 View
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2004-09-15 NOA Notice of Allowance and Fees Due (PTOL-85) 4 View
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2004-09-15 SRFW Search information including classification, databases and other search related notes 1 View
2004-07-28 A... Amendment/Request for Reconsideration-After Non-Final Rejection 2 View
2004-07-28 CLM Claims 1 View
2004-07-28 REM Applicant Arguments/Remarks Made in an Amendment 2 View
2004-07-28 WFEE Fee Worksheet (SB06) 2 View
2004-07-28 FWCLM Index of Claims 1 View
2004-02-28 CTNF Non-Final Rejection 4 View
2004-02-28 1449 List of References cited by applicant and considered by examiner 1 View
2004-02-28 892 List of references cited by examiner 1 View
2004-02-28 FWCLM Index of Claims 1 View
2004-02-28 SRFW Search information including classification, databases and other search related notes 1 View
2003-12-29 SRNT Examiner's search strategy and results 1 View
2003-07-03 TRNA Transmittal of New Application 1 View
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Quick Facts
Patent No.
US 6,832,508
App. No.
10/613,451
Filed
2003-07-03
Granted
2004-12-21
Pub. No.
US20040016286A1
Art Unit
2856
PTA
-61 days