Image sensor providing improved image quality
View Patent ↗An image sensor for capturing image, has: a plurality of pixels arranged in a matrix each including a photoelectric conversion element for generating current according to received light intensity and a reset transistor for resetting a node of the photoelectric conversion element to a reset potential; and a sample hold circuit for sample holding a pixel potential according to the potential of the node of the pixel. And the sample hold circuit outputs the differential potential, between a first pixel potential at an end of the integration period after a first reset operation of the pixel and a second pixel potential at an end of a reset noise read period after a second reset operation after the integration period, as a pixel signal. Also in the sample hold circuit, when the second pixel potential during the reset noise read period exceeds a predetermined threshold level, the second pixel potential is set to a predetermined reference potential.
1. An image sensor for capturing image, comprising:
a plurality of pixels arranged in a matrix, each including a photoelectric conversion element for generating current according to received light intensity and a reset transistor for resetting a node of the photoelectric conversion element to a reset potential; and
a sample hold circuit for sample holding a pixel potential according to a potential of said node of said pixels,
wherein said sample hold circuit outputs, as a pixel signal, a differential potential between a first pixel potential at an end of an integration period after a first reset operation of said pixels and a second pixel potential at an end of a reset noise read period after a second reset operation after said integration period, and
in said sample hold circuit, when said pixel potential during said reset noise read period exceeds a predetermined threshold level, said pixel potential is set to a predetermined reference potential.
2. The image sensor according to claim 1 , wherein said predetermined reference potential is said reset potential.
3. The image sensor according to claim 1 , wherein the setting of said predetermined threshold value can be changed to a plurality of levels.
4. The image sensor according to claim 3 , wherein the setting of said predetermined threshold level can be changed according to the received light intensity from the captured image.
5. An image sensor for capturing image, comprising:
a plurality of pixels arranged in a matrix, each including a photoelectric conversion element for generating current according to received light intensity and a reset transistor for resetting a node of said photoelectric conversion element to a reset potential; and
a sample hold circuit for sample holding a pixel potential according to a potential of said node of said pixels,
wherein said sample hold circuit outputs, as a pixel signal, a first differential potential between a first pixel potential at an end of an integration period after a first reset operation of said pixels and a second pixel potential at an end of a reset noise read period after a second reset operation after said integration period, and
said sample hold circuit outputs, as a pixel signal, a second differential potential between said first pixel potential and the pixel potential at the first reset, in stead of said first differential potential, when said pixel potential during said reset noise read period exceeds a predetermined threshold level.
6. The image sensor according to claim 5 , wherein the setting of said predetermined threshold level can be changed to a plurality of levels.
7. The image sensor according to claim 5 , wherein the setting of said predetermined threshold level can be changed according to the received light intensity from the captured image.
8. An image sensor for capturing image, comprising:
a plurality of pixels arranged in a matrix, each including a photoelectric conversion element for generating current according to received light intensity and a reset transistor for resetting a node of said photoelectric conversion element to a reset potential; and
a sample hold circuit for sample holding a pixel potential according to the potential of said node of said pixels,
wherein said sample hold circuit outputs, as a pixel signal, a differential potential between a first pixel potential at an end of an integration period after a first reset operation of said pixels and a second pixel potential at an end of a reset noise read period after a second reset operation after said integration period, and
said sample hold circuit further comprises a control circuit which detects that said pixel potential exceeds a predetermined threshold level in said reset noise read period so as to set said second pixel potential to the reset potential.
9. The image sensor according to claim 8 , wherein the setting of said predetermined threshold level can be changed to a plurality of levels.
10. The image sensor according to claim 8 , wherein the setting of said predetermined threshold level can be changed according to the received light intensity from the captured image.