IP Library Granted Patent US 7,130,027
Granted Patent B2
US 7,130,027 · App. 10/620,217 · Granted Oct 31, 2006

Reflection-photometric analytical system

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Quick Facts
Patent No.
US 7,130,027
App. No.
10/620,217
Granted
Oct 31, 2006
Kind
B2
Abstract

This invention generally relates to a reflection-photometric analytical system having a measuring head comprising a source of radiation and a radiation detector for the reflection-photometric analysis of a target surface of a test object arranged at a distance from the measuring head and in particular of a test strip for body fluids such as urine or blood. A triangulation unit operating on the basis of optical triangulation is proposed for contact free checking of the distance in order to monitor or regulate the measuring distance.

Claims (30)

1. An analytical system for reflectometric analysis of an analyte in a sample liquid comprising:

a test strip provided with a test field for application of the sample liquid wherein the test field including the applied sample liquid has a target surface;

a measuring head arranged at a distance from the target surface, wherein the measuring head comprises a source for radiating the target surface and a detector for measuring radiation reflected by the target surface;

an optical triangulation unit for detecting the distance between the measuring head and the target surface, wherein the triangulation unit comprises a light emitter directed towards the target surface in an incidence axis and a light receiver pointing towards the target surface in the direction of a receiving axis and wherein the incidence and receiving axis intercept at a reference point; and

a control device for adjusting the distance between the measuring head and the target surface to a predetermined value, thereby permitting accurate analysis of the analyte by the measuring head.

2. The analytical system as claimed in claim 1 , wherein the reference point defines a reference position of the target surface.

3. The analytical system as claimed in claim 1 , wherein the incidence and receiving axis enclose different angles relative to a perpendicular on the target surface.

4. The analytical system as claimed in claim 1 , wherein the light receiver has a sensor, which is position-resolving at right angles to the receiving axis.

5. The analytical system as claimed in claim 4 , wherein the sensor is a PSD sensor, CCD sensor or multi-element diode sensor.

6. The analytical system as claimed in claim 1 , wherein the light receiver is a double sensor with two single sensors preferably arranged next to one another and symmetrically to the receiving axis.

7. The analytical system as claimed in claim 1 , wherein the light receiver has a collecting optical system whose optical axis defines the receiving axis for focussing the light reflected from the target surface.

8. The analytical system as claimed in claim 1 , wherein the light emitter has a light source and a collimating optical system whose optical axis defines the incidence axis for generating a light beam which is incident on the target surface.

9. The analytical system as claimed in claim 1 , wherein the light emitter has a modulation stage for the time-varying actuation of a light source.

10. The analytical system as claimed in claim 1 , wherein the light emitter has an edge generator to produce non-linear increasing or decreasing light pulses.

11. The analytical system as claimed in claim 1 , wherein the triangulation unit has a signal processing circuit for determining changes in the distance relative to a reference position on the target surface.

12. The method as claimed in claim 11 , wherein the changes in the distance relative to a reference distance of the target surface are detected by means of a corresponding light deflection onto a light receiver of the triangulation unit.

13. The method as claimed in claim 11 , wherein the distance is kept constant at the predetermined value by means of a control device.

14. The analytical system as claimed in claim 11 , wherein the signal processing circuit has a comparator and a timer to determine the time interval between specified signal amplitudes of output signals of the triangulation unit.

15. The analytical system as claimed in claim 1 , wherein the control device sets the constant measuring distance between the target surface and measuring head by means of a servodrive.

16. The analytical system as claimed in claim 1 , further comprising a path measuring device to record the path of the measuring head for determining a height profile of the test object.

17. The analytical system as claimed in claim 16 , wherein the path measuring device has a height profile store to identify the test object.

18. The analytical system as claimed in claim 1 , further comprising an evaluation unit to standardize the results of the photometric triangulation unit on the basis of the distance between the target surface and the head.

19. The analytical system as claimed in claim 1 , wherein the light source is at the same time the light emitter or the radiation detector is at the same time the light receiver of the triangulation unit.

20. The analytical system as claimed in claim 1 , wherein the light emitter has a modulation stage for the pulse-shaped actuation of a light source.

21. The analytical system as claimed in claim 1 , wherein the light emitter has an edge generator to produce exponentially increasing or decreasing light pulses.

22. A method for reflectometric analysis of an analyte in a sample liquid comprising:

applying the sample liquid to a surface of a test strip to form a test field having a target surface;

arranging the target surface as a distance from a measuring head, wherein the measuring head comprises a source for radiating the sample and a detector for measuring radiation reflected by the sample;

detecting the distance between the measuring head and target surface by means of an optical triangulation unit comprising a light emitter directed towards the target surface in an incidence axis and a light receiver pointing towards the target surface in the direction of a receiving axis; and

adjusting, by means of a control device, the distance between the measuring head and the target surface to a predetermined value, thereby permitting accurate analysis of the analyte by the measuring head.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2004
From: ROCHE DIAGNOSTICS CORPORATION
To: ROCHE DIAGNOSTICS OPERATIONS, INC.
Reel/Frame 015421/0730 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 16, 2004
From: ROCHE DIAGNOSTICS CORPORATION
To: ROCHE DIAGNOSTICS OPERATIONS, INC.
Reel/Frame 015201/0368 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 17, 2004
From: ROCHE DIAGNOSTICS GMBH
To: ROCHE DIAGNOSTICS CORPORATION
Reel/Frame 015330/0284 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 15, 2003
From: ZIEGLER, FRIEDRICH
To: ROCHE DIAGNOSTICS GMBH
Reel/Frame 014311/0897 →