Electrical lead structures having crystalline structures that match underlying magnetic hard bias layers for magnetoresistive sensors
View Patent ↗A magnetic head including an electrical lead layer that is comprised of a material having an ordered crystalline structure. In a preferred embodiment, the ordered crystalline structure of the electrical lead is epitaxially matched to the crystalline structure of the hard bias layer upon which it is formed, and there is no need for a seed layer for the electrical leads. Electrical leads having an ordered crystalline structure, particularly a B2, L1 0 , L1 1 , L1 2 and D0 3 structure, will have significantly reduced resistivity over the prior art electrical leads that are typically composed of rhodium or tantalum. As a result, thinner electrical leads can be fabricated which carry the same, or even greater, current than the prior art rhodium or tantalum leads. The preferred leads are comprised of NiAl having a B2 crystalline structure, and alternative embodiments are comprised of CuAu, Cu 3 Au, Ni 3 Al and Fe 3 Al.
1. A magnetic head having a magnetoresistive sensor, comprising:
a plurality of sensor layers;
a hard bias/lead structure being disposed at side areas of said sensor layers, said hard bias/lead structure including: a hard bias layer having a crystalline structure and electrical lead layer having an ordered crystalline structure, and wherein said crystalline structure of said lead is epitaxially matched to said crystalline structure of said hard bias layer, and wherein said hard bias layer is composed of a cobalt alloy, and wherein said lead layer is formed with a B2 structure.
2. A magnetic head as described in claim 1 wherein said lead layer is composed of NiAl.
3. A magnetic head as described in claim 1 wherein said lead layer is comprised of NiAl, wherein the Ni composition ranges from approximately 45% to approximately 60%.
4. A magnetic head as described in claim 3 wherein said Ni composition is approximately 50%.
5. A magnetic head having a magnetoresistive sensor, comprising:
a plurality of sensor layers;
a hard bias/lead structure being disposed at side areas of said sensor layers, said hard bias/lead structure including an electrical lead layer having an ordered crystalline structure; and wherein said electrical lead layer ordered crystalline structure is selected from the group consisting of B2, L1 0 , L1 1 , L1 2 and D0 3 .
6. A magnetic head having a magnetoresistive sensor, comprising:
a plurality of sensor layers;
a hard bias/lead structure being disposed at side areas of said sensor layers, said hard bias/lead structure including an electrical lead layer having an ordered crystalline structure; and wherein said electrical lead layer is comprised of a material selected from the group consisting of NiAl, CuAu, Cu 3 Au, Ni 3 Al and Fe 3 Al.
7. A magnetic head having a magnetoresistive sensor, comprising:
a plurality of sensor layers;
a hard bias/lead structure being disposed at side areas of said sensor layers, said hard bias/lead structure including a hard bias layer that is comprised of a cobalt alloy, and an electrical lead layer that is comprised of an NiAl alloy and is deposited directly upon said hard bias layer.
8. A magnetic head as described in claim 7 wherein said NiAl electrical lead has a B2 crystalline structures.
9. A magnetic head as described in claim 7 wherein said NiAl lead layer includes Ni having a composition between 45% Ni and 60% Ni.
10. A magnetic head as described in claim 9 wherein said Ni composition is approximately 50%.
11. A hard disk drive including a magnetic head having a magnetoresistive sensor, comprising:
a plurality of sensor layers;
a hard bias/lead structure being disposed at side areas of said sensor layers, said hard bias/lead structure including:
a hard bias layer having a crystalline structure and electrical lead layer having an ordered crystalline structure, and wherein said crystalline structure of said lead is epitaxially matched to said crystalline structure of said hard bias layer; and wherein said hard bias layer is composed of a cobalt alloy, and wherein said lead layer is formed with a B2 structure.
12. A hard disk drive as described in claim 11 wherein said lead layer is composed of NiAl.
13. A hard disk drive as described in claim 11 wherein said lead layer is comprised of NiAl, wherein the Ni composition ranges from approximately 45% to approximately 60%.
14. A hard disk drive as described in claim 13 wherein said Ni composition is approximately 50%.
15. A hard disk drive including a magnetic head having a magnetoresistive sensor, comprising:
a plurality of sensor layers;
a hard bias/lead structure being disposed at side areas of said sensor layers, said hard bias/lead structure including an electrical lead layer having an ordered crystalline structure; and wherein said ordered crystalline structure is selected from the group consisting of B2, L1 0 , L1 1 , L1 2 and D0 3 .
16. A hard disk drive including a magnetic head having a magnetoresistive sensor, comprising:
a plurality of sensor layers;
a hard bias/lead structure being disposed at side areas of said sensor layers, said hard bias/lead structure including an electrical lead layer having an ordered crystalline structure; and wherein said electrical lead is comprised of a material selected from the group consisting of NiAl, CuAu, Cu 3 Au, Ni 3 Al and Fe 3 Al.
17. A hard disk drive including a magnetic head having a magnetoresistive sensor, comprising:
a plurality of sensor layers;
a hard bias/lead structure being disposed at side areas of said sensor layers, said hard bias/lead structure including a hard bias layer that is comprised of a cobalt alloy, and an electrical lead layer that is comprised of an NiAl alloy and is deposited directly upon said hard bias layer.
18. A hard disk drive as described in claim 17 wherein said NiAl electrical lead has a B2 crystalline structure.
19. A hard disk drive as described in claim 17 wherein said NiAl lead layer includes Ni having a composition between 45% Ni and 60% Ni.
20. A hard disk drive as described in claim 19 wherein said Ni composition is approximately 50%.