IP Library Granted Patent US 6,879,013
Granted Patent B2
US 6,879,013 · App. 10/632,038 · Granted Apr 12, 2005

Amplifiers using spin injection and magnetic control of electron spins

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Quick Facts
Patent No.
US 6,879,013
App. No.
10/632,038
Granted
Apr 12, 2005
Kind
B2
Abstract

Ultrafast solid state amplifiers of electrical current, including power amplification devices, use injection of spin-polarized electrons from a magnetic region into another magnetic region through a semiconductor control region and electron spin precession inside the control region induced by a magnetic field resulting from a current flowing through a conductive nanowire. The amplifiers may include magnet-semiconductor-magnet heterostructures and are able to operate on electric currents and electromagnetic waves having frequencies up to 100 GHz or more.

Claims (48)

1. An amplifier comprising:

a first magnetic region having a first magnetization;

a control region forming a first interface with the first magnetic region;

a second magnetic region forming a second interface with the control region, the second magnetic region having a second magnetization that is substantially perpendicular to the first magnetization; and

a wire positioned relative to the control region so that a current through the wire creates in the control region a magnetic field that rotates spins of the electrons injected through the control region between the first magnetic region and the second magnetic region.

2. The amplifier of claim 1 , further comprising:

a first terminal connected to the first magnetic region;

a second terminal connected to the second magnetic region; and

a third terminal and a fourth terminal connected to ends of the wire, wherein a signal applied to the third and fourth terminals controls a current between the first and second terminals.

3. The amplifier of claim 1 , wherein the control region is such that an electron spin relaxation time of the control region is longer than a transit time of the electrons traversing the control region.

4. The amplifier of claim 1 , wherein the control region comprises a semiconductor material.

5. The amplifier of claim 4 , wherein the semiconductor material is selected from a group consisting of Si, Ge, GaAs, GaInAs, Ge, ZnSe, ZnCdSe, and alloys and combinations of these materials.

6. The amplifier of claim 4 , wherein the semiconductor material contains an n-type doping.

7. The amplifier of claim 1 , wherein the first magnetic region comprises a ferromagnetic material.

8. The amplifier of claim 1 , wherein the wire has a cross-sectional dimension less than 100 nm.

9. The amplifier of claim 1 , wherein the control region has a thickness less than 100 nm.

10. The amplifier of claim 1 , further comprising a substrate wherein:

the wire comprises a conductive region on the substrate;

the first magnetic region overlies the conductive region;

the control region overlies the first magnetic region; and

the second magnetic region overlies the control region.

11. The amplifier of claim 10 , further comprising an insulating layer between the conductive region and the first magnetic region.

12. The amplifier of claim 11 , wherein the insulating layer has a thickness that is greater than 2 nm and less than 20 nm.

13. The amplifier of claim 1 , further comprising a substrate wherein:

the first magnetic region is on the substrate;

the control region overlies the first magnetic region; and

the second magnetic region overlies the control region.

14. The amplifier of claim 13 , wherein the substrate comprises an anti-ferromagnetic material that is under the first magnetic region and that fixes the direction of the first magnetization.

15. The amplifier of claim 13 , wherein the wire comprises a first segment adjacent a first side of the control region.

16. The amplifier of claim 15 , wherein the wire further comprises a second segment adjacent a second side of the control region.

17. The amplifier of claim 16 , wherein the first segment and the second segment are connected in series such that current in the first segment has a direction opposite to current in the second segment.

18. The amplifier of claim 13 , wherein:

the control region comprises a plurality of parts, wherein each part is laterally separated from an adjacent part, and

the wire comprises a plurality of segments that reside in separations between the parts of the control region.

19. The amplifier of claim 18 , wherein the segments are connected such that current in each of the segments has a direction opposite to current in an adjacent one of the segments.

20. The amplifier of claim 13 , wherein the second magnetic region comprises a first part and a second part that are laterally separated from each other, the wire having a segment residing in a separation between the first and second parts of the second magnetic region.

21. The amplifier of claim 20 , wherein the first part of the second magnetic region has the second magnetization and the second part of the second magnetic region has a magnetization that is antiparallel to the second magnetization.

22. The amplifier of claim 20 , wherein the first part and the second part of the second magnetic region have the second magnetization.

23. A method for amplifying a signal current, comprising:

applying a first voltage difference between a first magnetic region and a second magnetic region that respectively form a first interface and a second interface with a semiconductor region that is between the first and second magnetic regions;

rotating spins of electrons injected through the semiconductor region between the first magnetic region and the second magnetic region by driving the signal current through a wire that is adjacent to the semiconductor region; and

extracting an amplified current from a current resulting from injection between the first magnetic region and the second magnetic region.

24. The method of claim 23 , wherein the first magnetic region has a first magnetization, the second magnetic region has a second magnetization, and the first magnetization is perpendicular to the second magnetization.

25. The method of claim 23 , wherein the semiconductor region is such that an electron spin relaxation time of the semiconductor region is longer than a transit time of the electrons traversing the semiconductor region.

26. The method of claim 23 , wherein driving the signal current comprises applying a voltage difference between terminals at opposite ends of the wire.

27. The method of claim 23 , wherein the wire has a cross-sectional dimension less than 100 nm.

28. The method of claim 23 , wherein the wire comprises a plurality of segments that reside in separations between parts of the semiconductor region.

29. The method of claim 28 , wherein the segments are connected such that current in each of the segments has a direction opposite to the current in an adjacent one of the segments.

Assignments (4)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 24, 2021
From: OT PATENT ESCROW, LLC
To: VALTRUS INNOVATIONS LIMITED
Reel/Frame 055403/0001 →
PATENT ASSIGNMENT, SECURITY INTEREST, AND LIEN AGREEMENT Recorded Jan 26, 2021
From: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP; HEWLETT PACKARD ENTERPRISE COMPANY
To: OT PATENT ESCROW, LLC
Reel/Frame 055269/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 9, 2015
From: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
To: HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
Reel/Frame 037079/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 20, 2003
From: OSIPOV, VIATCHESLAV V; BRATKOVSKI, ALEXANDRE M
To: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
Reel/Frame 014145/0987 →