IP Library Granted Patent US 6,939,574
Granted Patent B2
US 6,939,574 · App. 10/632,698 · Granted Sep 6, 2005

Method for reducing leaching in metal-coated MEMS

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Quick Facts
Patent No.
US 6,939,574
App. No.
10/632,698
Granted
Sep 6, 2005
Kind
B2
Abstract

A method is provided for preventing dopant leaching from a doped structural film during fabrication of a microelectromechanical system. A microstructure that includes the doped structural film, sacrificial material, and metallic material is produced with a combination of deposition, patterning, and etching techniques. The sacrificial material is dissolved with a release solution that has a substance destructive to the sacrificial material. This substance also acts as an electrolyte, forming a galvanic cell with the doped structural film and metallic material acting as electrodes. The effects of the galvanic cell are suppressed by including a nonionic detergent mixed in the release solution.

Claims (25)

1. A method for fabricating a microelectromechanical system, the method comprising:

producing an intermediate microstructure that includes a doped structural film, sacrificial material, and metallic material;

dissolving the sacrificial material from the intermediate microstructure with an acid to form the microelectromechanical system; and

suppressing dopant leaching from the doped structural film while dissolving the sacrificial material by including a nonionic detergent in the acid.

2. The method recited in claim 1 wherein the doped structural film comprises a doped semiconductor.

3. The method recited in claim 1 wherein the doped structural film comprises doped silicon.

4. The method recited in claim 3 wherein the doped structural film comprises doped polysilicon.

5. The method recited in claim 1 wherein the metallic material comprises a material selected from the group consisting of gold, aluminum, copper, platinum, and nickel.

6. The method recited in claim 1 wherein the nonionic detergent comprises an alkyl group and a polyether-linked hydroxy group commonly linked to an aryl group.

7. The method recited in claim 1 wherein the nonionic detergent is included with a concentration relative to the acid approximately between 0.01 and 0.1 vol. %.

8. The method recited in claim 1 wherein the nonionic detergent comprises a hydrophilic moiety and a hydrophobic moiety commonly linked to an aryl group.

9. A microelectromechanical system fabricated according to the method recited in claim 1 .

10. A method for fabricating a microelectromechanical system, the method comprising:

producing an intermediate microstructure that includes a doped silicon film, sacrificial material, and a metallic material selected from the group consisting of gold, aluminum, copper, platinum, and nickel;

dissolving the sacrificial material from the intermediate microstructure with an acid to form the microelectromechanical system; and

suppressing dopant leaching from the doped silicon film while dissolving the sacrificial material by including a substance comprising an alkyl group and a polyether-linked hydroxy group commonly linked to an aryl group in the acid.

11. The method recited in claim 10 wherein the doped silicon film comprises a doped polysilicon film.

12. The method recited in claim 10 wherein the substance is included with a concentration relative to the acid approximately between 0.01 and 0.1 vol. %.

13. A microelectromechanical system made according to the method recited in claim 10 .

14. A method for fabricating a microelectromechanical system, the method comprising:

producing an intermediate microstructure that includes a doped silicon film, sacrificial material, and a metallic material selected from the group consisting of gold, aluminum, copper, platinum, and nickel;

dissolving the sacrificial material from the intermediate microstructure with an acid to form the microelectromechanical system; and

suppressing dopant leaching from the doped structural film while dissolving the sacrificial material by including a substance comprising a hydrophilic moiety and a hydrophobic moiety commonly linked to an aryl group in the solution.

15. The method recited in claim 14 wherein the doped silicon film comprises a doped polysilicon film.

16. The method recited in claim 14 wherein the substance is included with a concentration relative to the acid approximately between 0.01 and 0.1 vol. %.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 2, 2006
From: PTS CORPORATION
To: ALTERA CORPORATION
Reel/Frame 018720/0569 →