IP Library Granted Patent US 7,211,195
Granted Patent B2
US 7,211,195 · App. 10/633,765 · Granted May 1, 2007

Method for providing a liftoff process using a single layer resist and chemical mechanical polishing and sensor formed therewith

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Quick Facts
Patent No.
US 7,211,195
App. No.
10/633,765
Granted
May 1, 2007
Kind
B2
Abstract

A method for providing a liftoff process using a single layer resist and chemical mechanical polishing and sensor formed therewith are disclosed. Chemical mechanical polishing is combined with liftoff using only a single resist layer to allow the removal of leftover fencing on the side of a lifted resist pattern.

Claims (24)

1. A method for forming leads, comprising:

forming a liftoff mask having a desired width;

forming leads contiguous to and on opposite sides of the liftoff mask;

removing the liftoff mask, the removal of the liftoff mask leaving fencing on the leads;

forming a layer of carbon over the leads after removal of the mask; and

performing chemical mechanical polishing on the leads at the fencing to preferentially remove a portion of the leads including the fencing and a portion of the carbon layer.

2. The method of claim 1 wherein the desired width of the liftoff mask is a trackwidth for a magnetoresistive sensor.

3. The method of claim 1 wherein the forming a liftoff mask having a desired width further comprises forming a single layer liftoff mask.

4. The method of claim 1 , further comprising removing any remaining carbon using an oxygen plasma.

5. The method of claim 1 wherein the forming leads on opposite sides of the liftoff mask further comprises depositing leads using a sputtering process.

6. A method for forming a magnetic read sensor, comprising:

forming a magnetoresistive sensor element; and

forming leads to the magnetoresistive sensor element, the forming the leads to the magnetoresistive sensor element further comprising:

forming a liftoff mask having a desired width over the magnetoresistive sensor element;

forming leads contiguous to and on opposite sides of the liftoff mask and in contact with the magnetoresistive sensor element;

removing the liftoff mask, the removal of the liftoff mask leaving fencing on the leads;

forming a layer of carbon over the leads after removal of the mask; and

performing chemical mechanical polishing on the leads at the fencing to preferentially remove a portion of the leads including the fencing and a portion of the carbon layer.

7. The method of claim 6 wherein the desired width of the liftoff mask is a trackwidth for the magnetoresistive read sensor.

8. The method of claim 6 wherein the forming a liftoff mask having a desired width further comprises forming a single layer liftoff mask.

9. The method of claim 6 , further comprising removing any remaining carbon using an oxygen plasma.

10. The method of claim 6 wherein the forming leads on opposite sides of the liftoff mask further comprises depositing leads using a sputtering process.

11. The method of claim 6 wherein the forming the magnetoresistive sensor element further comprises forming an anisotropic magnetoresistive (AMR) sensor element.

12. The method of claim 6 wherein the forming the magnetoresistive sensor element further comprises forming a giant magnetoresistive (GMR) sensor element.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040820/0802 →
CHANGE OF NAME Recorded Oct 25, 2012
From: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
To: HGST NETHERLANDS B.V.
Reel/Frame 029341/0777 →