Semiconductor device having contact prevention spacer
View Patent ↗There is provided a semiconductor device in which substantially no deformation of a bonded wire occurs, and a method for producing the semiconductor device. A wiring pattern of a wiring substrate and an electrode of an IC chip are connected by a wire. A contact prevention resin whose height is higher than the highest position of the bonded wire, is adhered to the approximate center of the surface of the IC chip. If the wiring substrate warps due to heat from the lower metallic mold, an inner surface of an upper metallic mold placed on the wiring substrate abuts against the contact prevention resin, and decrease warpage of the wiring substrate. Accordingly, the wire is kept from contacting the inner surface of the upper metallic mold. Thereafter, the IC chips, the wires, and the like are sealed by injecting a mold resin into the molds.
1. A semiconductor device comprising:
(a) a semiconductor element having an electrode on the surface thereof;
(b) a wiring substrate having a wiring pattern for external connection, the semiconductor element being fixed to a front surface of said wiring substrate by an adhesive agent applied to a reverse surface of said semiconductor element;
(c) a metal wire connecting the electrode on said semiconductor element to the wiring pattern on said wiring substrate;
(d) contact prevention resin having a predetermined height, for preventing contact with the metal wire during sealing of the semiconductor device, the contact prevention resin being fixed substantially at the center of the surface of said semiconductor element, and being sized so as not to cover the electrode on, and the metal wire connected to, the semiconductor element; and
(e) mold resin sealing and protecting the surface of said wiring substrate, said semiconductor element, said metal wire, and said contact prevention resin,
wherein the predetermined height of said contact prevention resin is higher than a maximum highest position of said metal wire above the surface of said semiconductor element, and
wherein said contact prevention resin is not exposed through said mold resin.
2. The semiconductor device of claim 1 , wherein said wiring substrate is made of glass epoxy.
3. The semiconductor device of claim 1 , wherein solder balls electrically connected to the wiring pattern are provided on a rear surface of said wiring substrate.
4. The semiconductor device of claim 1 , wherein said mold resin is coextensive with said front surface of said wiring substrate.
5. A semiconductor device comprising:
(a) a semiconductor element having an electrode on the surface thereof;
(b) a wiring substrate having a wiring pattern for external connection, the semiconductor element being fixed to a front surface of said wiring substrate by an adhesive agent applied to a reverse surface of said semiconductor element;
(c) a metal wire connecting the electrode on said semiconductor element to the wiring pattern on said wiring substrate;
(d) contact prevention resin having a predetermined height, for preventing contact with the metal wire during sealing of the semiconductor device in a mold, the contact prevention resin being fixed substantially at the center of the surface of said semiconductor element, and being sized so as not to cover the electrode on, and the metal wire connected to, the semiconductor element; and
(e) mold resin sealing and protecting the surface of said wiring substrate, said semiconductor element, said metal wire, and said contact prevention resin,
wherein the predetermined height of said contact prevention resin is higher than a maximum highest position of said metal wire above the surface of said semiconductor element.
6. The semiconductor device of claim 5 , wherein said wiring substrate is made of glass epoxy.
7. The semiconductor device of claim 5 , wherein solder balls electrically connected to the wiring pattern are provided on a rear surface of said wiring substrate.
8. The semiconductor device of claim 5 , wherein said mold resin is coextensive with said front surface of said wiring substrate.