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App. No. 10/637,730 · Confirmation No. 3301

High throughput screening assay systems in microscale fluidic devices

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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2005-07-12 ABN Abandonment 2 View
2005-07-12 EXIN Examiner Interview Summary Record (PTOL - 413) 1 View
2005-07-06 XT/ Extension of Time 1 View
2005-01-06 CTNF Non-Final Rejection 4 View
2005-01-06 1449 List of References cited by applicant and considered by examiner 6 View
2005-01-06 BIB Bibliographic Data Sheet 2 View
2005-01-06 FWCLM Index of Claims 1 View
2005-01-06 SRFW Search information including classification, databases and other search related notes 1 View
2005-01-04 SRNT Examiner's search strategy and results 3 View
2004-12-28 EBCC.AD Notice of Change of Address Place in File Wrapper Due to Electronic Business Center(EBC) Customer Number Update 1 View
2004-03-03 IDS Information Disclosure Statement (IDS) Form (SB08) 9 View
2003-08-07 TRNA Transmittal of New Application 2 View
2003-08-07 ADS Application Data Sheet 3 View
2003-08-07 SPEC Specification 49 View
2003-08-07 CLM Claims 3 View
2003-08-07 ABST Abstract 1 View
2003-08-07 DRW Drawings-only black and white line drawings 19 View
2003-08-07 OATH Oath or Declaration filed 4 View
2003-08-07 WFEE Fee Worksheet (SB06) 1 View
2003-08-07 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
10/637,730
Filed
2003-08-07
Pub. No.
US20040028567A1
Art Unit
1753