Calibration pattern unit
View Patent ↗A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system comprises a calibration pattern which has a known geometric pattern formed on a plurality of three-dimensionally arranged planes, and a relative position and posture fixing section which fixes relative position and posture between the calibration pattern and the imaging system.
1. A calibration pattern unit which obtains correction information of an imaging system by imaging at the imaging system, the unit comprising:
a calibration pattern in which a predetermined pattern is formed on one of a plurality of three-dimensionally arranged planes and one or more curved surfaces; and
an imaging area and posture instruction section configured to instruct an area of a boundary of a field angle to be imaged when the calibration pattern is imaged, to definitely determine a position and posture of the imaging system relative to the calibration pattern and a size of an imaging range, so that the calibration pattern can be imaged as large as possible in a field of view of observing the boundary.
2. The unit according to claim 1 , wherein
the unit comprises a plurality of imaging systems which enable imaging of the object from a plurality of view points, and
the imaging area and posture instruction section corresponds to only one of the plurality of imaging systems.
3. The unit according to claim 1 , wherein
the unit comprises a plurality of imaging systems which enable imaging of the object from a plurality of view points, and
the imaging area and posture instruction section corresponds to the plurality of imaging systems.