IP Library Granted Patent US 7,168,161
Granted Patent B2
US 7,168,161 · App. 10/659,433 · Granted Jan 30, 2007

Manufacturing method of solid-state image sensing device

Assignees: Renesas Technology Corp.; Renesas Eastern Japan Semiconductor Inc.
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Quick Facts
Patent No.
US 7,168,161
App. No.
10/659,433
Granted
Jan 30, 2007
Kind
B2
Abstract

In a method of manufacturing a camera module having a CMOS image sensor, a semiconductor chip to serve as a light sensor is mounted on a optical-component-mounting face of a wiring substrate mother board and, after bonding wires are connected to the semiconductor chip, a lens barrel is joined to the wiring substrate mother board so as to cover the semiconductor chip. A position adjustment pin and a through hole are provided on the lens barrel and the wiring substrate mother board respectively outside a junction face between the lens barrel and the wiring substrate mother board to be used for adjusting the position of the lens barrel with respect to the wiring substrate mother board by inserting the position adjustment pin into the through hole.

Claims (20)

1. A method of manufacturing a solid-state image sensing device comprising the steps of:

(a) preparing a wiring substrate mother board having a first face and a second face on the side opposite to said first face;

(b) mounting first electronic components over said first face of said wiring substrate mother board;

(c) encapsulating said first electronic components by using an encapsulation body;

(d) mounting second electronic components including image sensors over said second face of said wiring substrate mother board; and

(e) joining a frame to said second face of said wiring substrate mother board so as to cover said second electronic components,

wherein said frame has a position adjustment pin for adjusting the position of said frame with said wiring substrate mother board,

wherein said wiring substrate mother board has a through hole into which said position adjustment pin is to be inserted, and

wherein said position adjustment pin and said through hole are provided outside a junction face between said frame and said wiring substrate mother board,

wherein said step (e) includes a sub-step of selectively coating a junction face of said frame with a bonding agent through a mask, and said sub-step of selectively coating a junction face of said frame with a bonding agent is carried out in such a way that said position adjustment pin of said frame is not coated with said bonding agent.

2. The method of manufacturing a solid-state image sensing device according to claim 1 , wherein in said step (c), said encapsulation body is formed in such a way that said through hole of said wiring substrate mother board is avoided.

3. The method of manufacturing a solid-state image sensing device according to claim 1 ,

wherein said wiring substrate mother board has a plurality of module regions,

wherein said encapsulation body used in said step (c) is a batch encapsulation body for encapsulating said first electronic components in said module regions in the aggregate, and

wherein in said step (c), said batch encapsulation body is formed in such a way that said through hole of said wiring substrate mother board is avoided.

4. The method of manufacturing a solid-state image sensing device according to claim 3 , wherein in said step (c), a plurality of said batch encapsulation bodies is formed over said first face of said wiring substrate mother board with said batch encapsulation bodies being separated from each other.

5. The method of manufacturing a solid-state image sensing device according to claim 4 , wherein a depression is formed in a portion of each of said batch encapsulation bodies.

6. The method of manufacturing a solid-state image sensing device according to claim 3 , wherein in said step (c), said module regions are divided into a plurality of groups and a plurality of said first electronic components in each of said groups is encapsulated in the aggregate.

7. The method of manufacturing a solid-state image sensing device according to claim 6 , wherein in said step (c), an encapsulation material is supplied to any particular one of said groups through an encapsulation-material-supplying path provided for said particular one of said groups so as to form said encapsulated body for said particular one of said groups in the aggregate.

8. The method of manufacturing a solid-state image sensing device according to claim 1 , wherein said image sensors are each a CMOS image sensor.

Assignments (3)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
MERGER Recorded Jul 7, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024662/0280 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 3, 2004
From: HANADA, KENJI; ISHIZU, AKIO
To: RENESAS TECHNOLOGY CORP.; RENESAS EASTERN JAPAN SEMICONDUCTOR INC.
Reel/Frame 014961/0137 →
Priority Claims (1)
JP 2003-300217 · Aug 25, 2003 · national
Continuity (1)
Related Publication 20050048692A1 · Mar 3, 2005