IP Library › Granted Patent US 6,972,577
Granted Patent B2
US 6,972,577 · App. 10/660,189 · Granted Dec 6, 2005

Voltage testing and measurement

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 6,972,577
App. No.
10/660,189
Granted
Dec 6, 2005
Kind
B2
Abstract

An improved voltage test system.

Claims (6)

1. A method of testing a device under test comprising:

(a) providing a coherent beam of light from a light source having a first wavelength;

(b) imposing said coherent beam of light on a test device over a spatial region within said test device greater than said first wavelength, wherein said test device has a first state;

(c) imposing said beam of light on said test device over a spatial region within said test device greater than said first wavelength, wherein said test device has a second state;

(d) obtaining data resulting from the interference of said first beam and said second beam within said device under test representative of the voltages within said region;

(e) wherein said first state is at a first voltage potential, and wherein said second state is at a second voltage potential different from said first voltage potential.

Assignments (1)
CONFIRMATORY ASSIGNMENT Recorded Jul 22, 2015
From: PFAFF, PAUL; RUSSELL, KEVIN
To: ATTOFEMTO, INC.
Reel/Frame 036160/0197 →