IP Library Granted Patent US 6,987,348
Granted Patent B2
US 6,987,348 · App. 10/664,472 · Granted Jan 17, 2006

Piezoelectric transducers

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Quick Facts
Patent No.
US 6,987,348
App. No.
10/664,472
Granted
Jan 17, 2006
Kind
B2
Abstract

A system and method of operation for a piezoelectric transducer is described which utilizes a mesa structure interposed between a piezoelectric material element and a chamber diaphragm. The system can be used as a sensor where a net motion to the diaphragm causes a net charge equal to the sum of the charges on each piezoelectric diaphragm. Alternatively, the system can be used as an actuator wherein an applied voltage causes movement of the piezoelectric transducer and the chamber diaphragm.

Claims (24)

1. A piezoelectric transducer comprising:

a) a chamber diaphragm having first and second opposing surfaces, a given chamber diaphragm thickness, and a given chamber diaphragm width,

b) a mesa having first and second opposing surfaces, a given mesa thickness, and a given mesa width wherein the first surface of the mesa is adjacent to the first surface of the chamber diaphragm, and

c) a first piezoelectric material element having a first piezoelectric material element width adjacent to the second surface of the mesa, and

d) a second piezoelectric material element having a second piezoelectric material element width adjacent to the second surface of the chamber diaphragm.

2. The piezoelectric transducer of claim 1 wherein the mesa further comprises an insulative layer at least partially on the second surface of the mesa.

3. The piezoelectric transducer of claim 1 further comprising an electrical contact layer at least partially interposed between the first piezoelectric material element and the second surface of the mesa.

4. The piezoelectric transducer of claim 1 wherein the mesa comprises a substantially insulative material.

5. The piezoelectric transducer of claim 1 wherein the mesa comprises a substantially conductive material.

6. The piezoelectric transducer of claim 1 wherein the chamber diaphragm comprises a substantially conductive material.

7. The piezoelectric transducer of claim 1 wherein the chamber diaphragm comprises a substantially non-conductive material.

8. The piezoelectric transducer of claim 1 wherein the mesa thickness is at least approximately 10% of the chamber diaphragm thickness.

9. The piezoelectric transducer of claim 1 wherein the mesa width is less than the chamber diaphragm width.

10. The piezoelectric transducer of claim 1 wherein the first piezoelectric material element width is greater than the mesa width.

11. The piezoelectric transducer of claim 10 wherein the piezoelectric material element width is greater than the chamber diaphragm width.

12. The piezoelectric transducer of claim 1 further comprising a second mesa having first and second opposing surfaces, a given second mesa thickness, and a given second mesa width interposed between the second piezoelectric material element and the second surface of the chamber diaphragm.

13. The piezoelectric transducer of claim 12 wherein the second mesa further comprises an insulative layer at least partially on the second surface of the mesa.

14. The piezoelectric transducer of claim 12 further comprising an electrical contact layer at least partially interposed between the second piezoelectric material element and the second mesa.

15. The piezoelectric transducer of claim 12 wherein the second mesa comprises a substantially insulative material.

16. The piezoelectric transducer of claim 12 wherein the second mesa comprises a substantially conductive material.

17. A piezoelectric transducer comprising:

a) a chamber diaphragm having first and second opposing surfaces, a given chamber diaphragm thickness, and a given chamber diaphragm width,

b) mesa having first and second opposing surface, a given mesa thickness, and a given mesa width wherein the first surface of the mesa is adjacent to the first surface of the chamber diaphragm, and

c) first and second piezoelectric material elements, each element having a given piezoelectric material element width wherein the first piezoelectric element is adjacent to the second surface of the mesa and the second piezoelectric element is adjacent to second surface of the chamber diaphragm.

Assignments (7)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RF 064760/0389 Recorded Feb 13, 2024
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: XEROX CORPORATION
Reel/Frame 068261/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVAL OF US PATENTS 9356603, 10026651, 10626048 AND INCLUSION OF US PATENT 7167871 PREVIOUSLY RECORDED ON REEL 064038 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jun 28, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064161/0001 →
SECURITY INTEREST Recorded Jun 22, 2023
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 064760/0389 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 20, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064038/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 8, 2005
From: WEYERHAEUSER COMPANY
To: NATIONAL INSTITUTE FOR STRATEGIC TECHNOLOGY ACQUISITIONS AND COMMERCIALIZATION
Reel/Frame 015676/0723 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 22, 2004
From: WEYERHAEUSER COMPANY
To: WEYERHAEUSER COMPANY
Reel/Frame 015487/0557 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 13, 2004
From: BUHLER, STEVEN A.; LITTAU, KARL A.; FITCH, JOHN S.; ANDREWS, JOHN R.; BURKE, CATHIE J.; NYSTROM, PETER J.; SCHMACHTENBERG, RICHARD, 111
To: PALO ALTO RESEARCH CENTER, INC.
Reel/Frame 014975/0352 →