Method of manufacturing optical device and inspection gauge used for the same
View Patent ↗A rectangular transparent sheet 15 is printed with black dotted density patterns 21 and 22 . Each dot of the patterns 21 and 22 is 30 μm in size while dotted area occupied rates of the patterns 21 and 22 range from 3% to 45%. The density patterns 21 and 22 are used for density level assessment of unevenness on a flat panel display device as standard references. Such density level assessment is carried out by comparing the unevenness with the patterns 21 and 22 or by visual inspection with the latter placed on the former.
1. A method of inspecting an optical device, comprising:
placing an inspection gauge on a main surface of said optical device, said inspection gauge being provided with a density pattern formed on a transparent sheet or film; and
comparing optical unevenness of said optical device with said density pattern of said inspection gauge in light of a density degree to determine whether said optical unevenness is lighter or darker in density than or equal to said density pattern of said inspection gauge.
2. The method according to claim 1 , wherein said optical device projects light from said main surface when said optical device is enabled.
3. The method according to claim 1 , wherein said inspection gauge is placed on said main surface of said optical device in order for said density pattern to be next to said optical unevenness.
4. The method according to claim 1 , wherein said inspection gauge is placed on said main surface of said optical device in order for said density pattern to cover said optical unevenness.
5. The method according to claim 1 , wherein said inspection gauge includes a plurality of different degree of density patterns.
6. The method according to claim 5 , wherein said different degree of density patterns are disposed in order of density degrees.
7. The method according to claim 6 , wherein said different degree of density patterns are applied in said order of density degrees to said optical unevenness for comparison with said optical unevenness or for inspection as to whether a difference between said different degree of density patterns and said optical unevenness is visible or not.
8. The method according to claim 1 , wherein at least one of said density patterns is made of dots provided on said sheet or film and said density degree is expressed by a rate of dots occupied per unit area.
9. The method according to claim 8 , wherein said dots are discrete circles or rectangles which are uniformly dispersed.
10. The method according to claim 8 , wherein said dots are of a predetermined size.
11. The method according to claim 8 , wherein said dots are less than or equal to 40 μm in size.
12. The method according to claim 8 , wherein said inspection gauge includes density patterns with different dot occupied rates and said dot occupied rates range from 3% through 45%.
13. The method according to claim 12 , wherein said density patterns of said inspection gauge include low density levels each defined by a discretely additional and predetermined dot occupied rate ranging from 1% to 3% and high density levels each defined by a discrete additional dot occupied rate of 5%.
14. The method according to claim 1 , wherein said optical device is a display panel.
15. The method according to claim 1 , wherein said optical device is an illumination apparatus.
16. An inspection gauge to assess optical unevenness on a main surface of an optical device, comprising:
a transparent base sheet or film; and
a density pattern provided on said base sheet or film,
wherein said density pattern is made of a set of dots which are less than or equal to 40 μm in size.