IP Library Granted Patent US 6,964,883
Granted Patent B2
US 6,964,883 · App. 10/670,207 · Granted Nov 15, 2005

Bi-directional silicon controlled rectifier for electrostatic discharge protection

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Quick Facts
Patent No.
US 6,964,883
App. No.
10/670,207
Granted
Nov 15, 2005
Kind
B2
Abstract

A bi-directional silicon controlled rectifier formed in a silicon layer and disposed over shallow trench isolations and therefore electrically isolated from the substrate to be insensitive to substrate noise for electrostatic discharge protection an electrostatic discharge protection device that includes a semiconductor substrate, including a first p-type portion, a first n-type portion contiguous with the first p-type portion, a second p-type portion contiguous with the first p-type portion and the first n-type portion, a second n-type portion, a third p-type portion, a third n-type portion contiguous with the third p-type portion, and a fourth p-type portion contiguous with the third p-type portion and the third n-type portion, wherein at least one of the first p-type portion, second p-type portion, third p-type portion, fourth p-type portion, first n-type portion, second n-type portion, and third n-type portion overlaps the isolation structure.

Claims (9)

1. A method for protecting a complementary metal-oxide semiconductor device from electrostatic discharge, comprising:

providing a bi-directional silicon controlled rectifier in the complementary metal-oxide semiconductor circuit;

isolating the bi-directional silicon controlled rectifier from a substrate of the complementary metal-oxide semiconductor circuit;

providing a signal pad coupled to the bi-directional silicon controlled rectifier for receiving an electrostatic discharge; and

protecting the device from the electrostatic discharge with the bi-directional silicon controlled rectifier.

2. The method as claimed in claim 1 , wherein the electrostatic discharge is a positive discharge.

3. The method as claimed in claim 1 , wherein the electrostatic discharge is a negative discharge.

4. The method as claimed in claim 1 , wherein the step of isolating the bi-directional silicon controlled rectifier from a substrate of the complementary metal-oxide semiconductor circuit includes a step of providing an insulator layer between the substrate and the bi-directional silicon controlled rectifier.

5. The method as claimed in claim 4 , further comprising a step of forming the bi-directional silicon controlled rectifier in a layer of silicon.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2007
From: CHANG, CHYH-YIH
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 019107/0467 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 3, 2006
From: INDUSTRIAL TECHNOLOGY RESERACH INSTITUTE
To: TRANSPACIFIC IP LTD.
Reel/Frame 018498/0272 →