Adjustable test head docking apparatus

1. Apparatus for establishing a distance between a test head having test head electrical contacts and a peripheral having peripheral electrical contacts, comprising

a plurality of alignment features which are coupled to one of said test head and said peripheral; and

a plurality of linear units coupled to the other of said test head and said peripheral for causing movement of at least one of respective docking surfaces of said test head and said peripheral towards and away from each other,

an actuating member which, when actuated, causes actuation of said plurality of linear units to cause said movement of said respective docking surfaces,

said alignment features and said linear units preventing said test head and said peripheral from being closer to each other than a docked distance,

wherein, at said docked distance, said test head electrical contacts and said peripheral electrical contacts are in contact with each other; and

a sliding unit for

a) changing position of said linear units relative to said other of said test head and said peripheral or

b) changing position of said alignment features relative to said one of said test head and said peripheral

in order to change said docked distance.

2. Apparatus for establishing a distance between a test head and a peripheral according to claim 1 , wherein said one of said test head and said peripheral is coupled to said alignment features for docking said one of said test head and said peripheral with said other of said test head and peripheral.

3. Apparatus for establishing a distance between a test head and a peripheral according to claim 1 , wherein one of said linear units includes one of a male and female threaded member attached to the other of said test head and peripheral.

4. Apparatus for establishing a distance between a test head and a peripheral according to claim 3 , wherein one of said alignment features includes the other of said male and said female member threaded member.

5. Apparatus for establishing a distance between a test head and a peripheral according to claim 3 , wherein said one of said male and female threaded member is rotated in order to move said alignment features towards or away from said docking surface of the other of said test head and said peripheral.

6. Apparatus for establishing a distance between a test head and a peripheral according to claim 4 , wherein the other of said male and female member is rotated in order to move said alignment features towards or away from said docking surface of the other of said test head and said peripheral.

7. Apparatus for establishing a distance between a test head and a peripheral according to claim 1 , wherein one of said linear units is coupled to a detent plate having a detent, said detent plate is coupled to the other of said test head and said peripheral, a lever is coupled to one of said alignment features and said lever engages said detent to indicate said frame is in an intended position relative to the other of said test head and said peripheral.

8. Apparatus of claim 1 , wherein said linear units are for moving said frame.

9. Apparatus of claim 7 , wherein said detent is one of a plurality of detents for indicating a respective plurality of intended positions of said one of said plurality of alignment features relative to the other of said test head and said peripheral.

10. Apparatus of claim 8 , wherein a crank is rotated to cause said plurality of linear units to move said frame.

11. Apparatus of claim 1 , wherein said docking surface is between said plurality of alignment features and said one of said test head and said peripheral.

12. Method for establishing a distance between a test head having test head electrical contacts and a peripheral having peripheral electrical contacts, comprising:

providing a plurality of alignment features which are coupled to one of said test head and said peripheral and which is are detached from the other of said test head and said peripheral; and

actuating a plurality of actuators to adjust said pluralitv of alignment features towards or away from a docking surface of said one of said test head and said peripheral to change said distance,

wherein said plurality of alignment features prevent said test head and said peripheral from being closer to each other than said distance, and, at said distance, said test head electrical contacts and said peripheral electrical contacts are in contact With each other.

13. Method according to claim 12 , wherein said one of said test head and said peripheral is coupled to said alignment features for docking said one of said test head and said peripheral with said other of said test head and peripheral.

14. Method according to claim 12 , wherein said actuating step includes the actuation of a linear unit, said linear unit is one of a male and female threaded member attached to the other of said test head and peripheral.

15. Method according to claim 14 , wherein one of said alignment features includes the other of said male and said female member threaded member.

16. Method according to claim 14 , wherein said one of said male and female threaded member is rotated in order to move one of said alignment features towards or away from said docking surface of the other of said test head and said peripheral.

17. Method according to claim 15 , wherein the other of said male and female member is rotated in order to move said one of said alignment features towards or away from said docking surface of the other of said test head and said peripheral.

18. Method according to claim 12 , wherein one of said actuators actuates said linear unit which is coupled to a detent plate having a detent, said detent plate is coupled to the other of said test head and said peripheral, a lever is coupled to one of said alignment features, and said lever engages said detent to indicate said one of said alignment features is in an intended position relative to the other of said test head and said peripheral.

19. Method according to claim 12 , wherein said actuators are for moving said frame.

20. Method according to claim 19 , wherein a crank is rotated to cause movement of said frame.

21. Method according to claim 12 , wherein said docking surface is between said plurality of actuators and said one of said test head and said peripheral.

22. Method according to claim 18 , wherein said detent is one of a plurality of detents for indicating a respective plurality of intended positions of said one of said actuators relative to the other of said test head and said peripheral.

23. Apparatus according to claim 1 , further comprising:

a guide coupled to the other of said test head and said peripheral;

said guide and one of said alignment features are separated prior to movement of at leastone of said docking surfaces;

said guide engaging said one of said alignment features at said distance.

24. Method according to claim 12 , said method further comprising the steps of:

providing a guide coupled to the other of said test head and said peripheral so that said guide and one of said alignment features are separated prior to said adjustable movement of at least one of said docking surfaces; and

allowing said guide to engage said one of said alignment features at said distance.