Automated electronic calibration apparatus
View Patent ↗Testing is performed on a device under test. A first port of a first calibration module is connected to the device under test. A second port of the first calibration module is connected to a network analyzer. A first port of a second calibration module is connected to the device under test. A second port of the second calibration module is connected to the network analyzer. A measurement calibration and testing are performed without disconnecting the first port and the second port of the first calibration module and without disconnecting the first port and the second port of the second calibration module.
1. A calibration module for connection between a device under test and a network analyzer comprising:
a controller;
a memory that stores calibration parameters for the calibration module; and,
a multi-state circuit, including:
a first port for connection to the device under test,
a second port for connection to the network analyzer,
a third port,
a first switch connected to the first port,
a second switch connected to the second port, and
a third switch connected to the third port;
wherein a first pole of the first switch, a first pole of the second switch, and a first pole of the third switch are all connected together through transmission lines.
2. A calibration module as in claim 1 wherein:
the first switch includes field effect transistors arranged so that the first switch can provide an open to the first port and can provide a short to the first port; and,
the second switch includes field effect transistors arranged so that the second switch can provide an open to the second port and can provide a short to the second port.
3. A calibration module as in claim 1 wherein:
the first switch is connected to the first port through a transmission line;
the second switch is connected to the second port through a transmission line; and,
the third switch is connected to the third port through a transmission line.
4. A calibration module as in claim 1 additionally comprising:
a data port operable to communicate with test equipment.
5. A calibration module comprising:
a controller;
a memory that stores calibration parameters for the calibration module;
a multi-state circuit, including:
a first port,
a second port,
a third port,
a first switch connected to the first port,
a second switch connected to the second port, and
a third switch connected to the third port, wherein a first pole of the first switch, a first pole of the second switch, and a first pole of the third switch are all connected together through transmission lines;
a fourth switch connected to a second pole of the first switch, a first pole of the fourth switch being connected to a first load; and,
a fifth switch connected to a second pole of the second switch, a first pole of the fifth switch being connected to a second load.
6. A calibration module as in claim 5 additionally comprising:
a first power sensor being connected to a second pole of the fourth switch; and,
a second power sensor being connected to a second pole of the fifth switch.
7. A calibration module as in claim 5 additionally comprising:
a first noise source being connected to a second pole of the fourth switch; and,
a second noise source being connected to a second pole of the fifth switch.
8. A multi-state circuit for use within a calibration module, the calibration module being for connection between a device under test and a network analyzer, the multi-state circuit comprising:
a first port for connection to the device under test;
a second port for connection to the network analyzer;
a third port;
a first switch connected to the first port;
a second switch connected to the second port; and,
a third switch connected to the third port;
wherein a first pole of the first switch, a first pole of the second switch, and a first pole of the third switch are all connected together through transmission lines.
9. A multi-state circuit as in claim 8 wherein:
the first switch includes field effect transistors arranged so that the first switch can provide an open to the first port and can provide a short to the first port; and,
the second switch includes field effect transistors arranged so that the second switch can provide an open to the second port and can provide a short to the second port.
10. A multi-state circuit for use within a calibration module, comprising:
a first port for connection to the device under test;
a second port for connection to the network analyzer;
a third port;
a first switch connected to the first port;
a second switch connected to the second port;
a third switch connected to the third port, wherein a first pole of the first switch, a first pole of the second switch, and a first pole of the third switch are all connected together through transmission lines;
a fourth switch connected to a second pole of the first switch, a first pole of the fourth switch being connected to a first load; and,
a fifth switch connected to a second pole of the second switch, a first pole of the fifth switch being connected to a second load.
11. A multi-state circuit as in claim 10 additionally comprising:
a first power sensor being connected to a second pole of the fourth switch; and,
a second power sensor being connected to a second pole of the fifth switch.
12. A multi-state circuit as in claim 10 additionally comprising:
a first noise source being connected to a second pole of the fourth switch; and,
a second noise source being connected to a second pole of the fifth switch.