Cathode ray tube with strengthened shadow mask
View Patent ↗A cathode ray tube comprising a panel having an outer surface which is substantially flat and an inner surface which has a radius of curvature, and a shadow mask having a plurality of apertures through which electron beams pass, wherein a ratio Sh/Sv of a horizontal dimension Sh of the aperture to a vertical dimension Sv of the aperture satisfies a condition of Sh/Sv<1 at a central portion of the shadow mask, and thereby improving strength of the shadow mask. Thusly, deformation of the shadow mask caused by an external impact or the like can be minimized, and a grade of color purity of a screen can be maintained optimally.
1. A cathode ray tube comprising:
a panel having an outer surface which is substantially flat and an inner surface which has a radius of curvature; and
a shadow mask having a plurality of apertures through which electron beams pass, each of the plurality of apertures at a central portion of the shadow mask having a continuously arcuate periphery, a ratio Sh/Sv of a horizontal dimension Sh of the aperture to a vertical dimension Sv of the aperture satisfying a condition of Sh/Sv<1 at the central portion of the shadow mask;
wherein, by defining the ratio Sh/Sv at the central portion of the shadow mask as A and the ratio Sh/Sv at an end portion of a diagonal axis of the shadow mask as B, a ratio B/A satisfies a condition of B/A≧1.1.
2. The cathode ray tube of claim 1 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv<1 at an end portion of a short axis of the shadow mask.
3. The cathode ray tube of claim 2 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv≧1 at an end portion of a diagonal axis of the shadow mask.
4. The cathode ray tube of claim 2 , wherein the ratio Sh/Sv satisfies Sh/Sv≧1 at an end portion in a long axis of the shadow mask.
5. The cathode ray tube of claim 1 , wherein the ratio Sh/Sv is satisfies a condition of 0.89≦Sh/Sv≦0.95 at the central portion of the shadow mask.
6. The cathode ray tube of claim 1 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv<1 on a short axis of the shadow mask.
7. The cathode ray tube of claim 1 , which is used for a monitor.
8. The cathode ray tube of claim 1 , wherein the ratio Sh/Sv satisfies a condition 0.90≦Sh/Sv≦0.96 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a short axis of the shadow mask.
9. The cathode ray tube of claim 1 , wherein the ratio Sh/Sv satisfied a condition 0.95≦Sh/Sv≦1.03 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a long axis of the shadow mask.
10. The cathode ray tube of claim 1 , wherein the ratio Sh/Sv satisfies a condition 0.95≦Sh/Sv≦1.05 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a diagonal axis of the shadow mask.
11. A cathode ray tube comprising:
a panel having an outer surface which is substantially flat and an inner surface which has a radius of curvature; and
a shadow mask having a plurality of apertures through which electron beams pass,
wherein a ratio Sh/Sv of a horizontal dimension Sh of the aperture to a vertical dimension Sv of the aperture satisfies a condition of 0.89≦Sh/Sv≦0.95 at a central portion of the shadow mask.
12. The cathode ray tube of claim 11 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv<1 at an end portion of a short axis of the shadow mask.
13. The cathode ray tube of claim 12 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv≧1 at an end portion of a diagonal axis of the shadow mask.
14. The cathode ray tube of claim 12 , wherein the ratio Sh/Sv satisfies Sh/Sv≧1 at an end portion in a long axis of the shadow mask.
15. The cathode ray tube of claim 11 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv<1 on a short axis of the shadow mask.
16. The cathode ray tube of claim 11 , wherein the ratio Sh/Sv satisfied a condition 0.95≦Sh/Sv≦1.03 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a long axis of the shadow mask.
17. The cathode ray tube of claim 11 , wherein the ratio Sh/Sv satisfies a condition 0.95≦Sh/Sv≦1.05 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a diagonal axis of the shadow mask.
18. A cathode ray tube comprising:
a panel having an outer surface which is substantially flat and an inner surface which has a radius of curvature; and
a shadow mask having a plurality of apertures through which electron beams pass,
wherein a ratio Sh/Sv of a horizontal dimension Sh of the aperture to a vertical dimension Sv of the aperture satisfies a condition of Sh/Sv<1 at a central portion of the shadow mask, and, by defining the ratio Sh/Sv at the central portion of the shadow mask as A and the ratio Sh/Sv at an end portion of a diagonal axis of the shadow mask as B, a ratio B/A satisfies a condition of B/A≧1.1.
19. The cathode ray tube of claim 18 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv<1 at an end portion of a short axis of the shadow mask.
20. The cathode ray tube of claim 19 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv≧1 at an end portion of a diagonal axis of the shadow mask.
21. The cathode ray tube of claim 19 , wherein the ratio Sh/Sv satisfies Sh/Sv≧1 at an end portion in a long axis of the shadow mask.
22. The cathode ray tube of claim 18 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv<1 on a short axis of the shadow mask.
23. The cathode ray tube of claim 18 , wherein the ratio Sh/Sv satisfied a condition 0.95≦Sh/Sv≦1.03 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a long axis of the shadow mask.
24. The cathode ray tube of claim 18 , wherein the ratio Sh/Sv satisfies a condition 0.95≦Sh/Sv≦1.05 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a diagonal axis of the shadow mask.
25. A cathode ray tube comprising:
a panel having an outer surface which is substantially flat and an inner surface which has a radius of curvature; and
a shadow mask having a plurality of apertures through which electron beams pass,
wherein a ratio Sh/Sv of a horizontal dimension Sh of the aperture to a vertical dimension Sv of the aperture satisfies a condition of Sh/Sv<1 at a central portion of the shadow mask, and the ratio Sh/Sv satisfies a condition 0.90≦Sh/Sv≦0.96 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a short axis of the shadow mask.
26. The cathode ray tube of claim 25 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv<1 at an end portion of a short axis of the shadow mask.
27. The cathode ray tube of claim 26 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv≧1 at an end portion of a diagonal axis of the shadow mask.
28. The cathode ray tube of claim 26 , wherein the ratio Sh/Sv satisfies Sh/Sv≧1 at an end portion in a long axis of the shadow mask.
29. The cathode ray tube of claim 25 , wherein the ratio Sh/Sv satisfies a condition of Sh/Sv<1 on a short axis of the shadow mask.
30. The cathode ray tube of claim 25 , wherein the ratio Sh/Sv satisfied a condition 0.95≦Sh/Sv≦1.03 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a long axis of the shadow mask.
31. The cathode ray tube of claim 25 , wherein the ratio Sh/Sv satisfies a condition 0.95≦Sh/Sv≦1.05 at a region corresponding to 80%˜95% of a distance from a center of the shadow mask to an end of a diagonal axis of the shadow mask.