Liquid crystal display device and fabricating method thereof, and reworking method of alignment film using the same
View Patent ↗A liquid crystal display device includes a substrate, an organic insulating film formed on the substrate, an alignment film having a first etch rate formed on the organic insulating film, and a silicon nitride layer having a second etch rate formed between the alignment film and the organic insulating film, wherein the first etch rate is different from the second etch rate.
1. A method of fabricating a liquid crystal display device, comprising the steps of:
forming an organic insulating film on a substrate;
forming an alignment film having a first etch rate on the organic insulating film; and
forming a silicon nitride layer having a second etch rate between the alignment film and the organic insulating film,
wherein the first etch rate is different from the second etch rate.
2. The method according to claim 1 , further including eliminating the alignment film by dry-etching during rework processing.
3. The method according to claim 2 , wherein the dry-etching is carried out by using at least one compound gas of SF 6 , O 2 +Cl 2 , and CF 4 .
4. The method according to claim 3 , wherein a ratio of the compound gas is at least about SF 6 :O 2 =1:50.
5. The method according to claim 3 , wherein a ratio of the compound gas is at least about SF 6 :O 2 =1:70.
6. The method according to claim 3 , wherein the dry-etching uses a radio frequency power of about 500-1500 W.
7. The method according to claim 1 , wherein the silicon nitride layer includes hydrogen.
8. The method according to claim 1 , further including the steps of:
forming a gate line and a gate electrode on the substrate;
forming a gate insulating film on the gate line, the gate electrode and the substrate;
forming a semiconductor layer on the gate insulating film; and
forming a data line, a source electrode and a drain electrode on the gate insulating film.
9. The method according to claim 8 , further including the step of forming a pixel electrode on the silicon nitride layer to overlap at least one of the data line and the gate line.