IP Library Granted Patent US 7,035,300
Granted Patent B2
US 7,035,300 · App. 10/700,845 · Granted Apr 25, 2006

Calibration of a multi-channel optoelectronic module with integrated temperature control

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,035,300
App. No.
10/700,845
Granted
Apr 25, 2006
Kind
B2
Abstract

A method for calibrating a multi-channel laser emitter in an optoelectronic transceiver or an optoelectronic transmitter for a first wavelength includes monitoring the wavelength of optical signals from the laser emitter while varying its temperature as well as other operating conditions, and then storing calibration information in the memory of a microprocessor. The initial values of the calibrating procedure are reset and the calibrating procedure is repeated to obtain calibration information for a next desired wavelength.

Claims (18)

1. A method of calibrating a multichannel optoelectronic assembly, comprising:

selecting first and second target wavelengths, separated from each other by a predefined channel separation amount;

setting a temperature of the optoelectronic assembly to a first value;

operating the optoelectronic assembly to emit light;

adjusting the temperature until a difference between an output wavelength of the optoelectronic assembly and the first target wavelength is less than a predefined value, and durably storing a first value corresponding to the adjusted temperature control as a first control value associated with the first target wavelength; and

adjusting the temperature until a difference between an output wavelength of the optoelectronic assembly and the second target wavelength is less than the predefined value, and durably storing a second value corresponding to the adjusted temperature as a second control value associated with the second target wavelength.

2. The method of claim 1 , including monitoring a laser temperature from within the optoelectronic assembly and an ambient temperature from within a housing in which the optoelectronic assembly resides, and adjusting the temperature of the optoelectronic assembly as a function of both the monitored laser temperature and the monitored ambient temperature.

3. The method of claim 1 , wherein the first value and the second value both correspond to temperatures within the range of 30° C. and 50° C.

4. A method of calibrating a multichannel optoelectronic assembly, comprising:

selecting as a target wavelength a wavelength from a set of wavelengths including two or more wavelengths;

setting a temperature of the optoelectronic assembly to a first value;

adjusting the temperature with increments greater than an adjustment amount until a difference between an output wavelength of the optoelectronic assembly and the target wavelength is less than a first predefined value;

setting one or more operating values of the optoelectronic assembly, said one or more operating values affecting the temperature;

adjusting the temperature with increments less than the adjustment amount until the difference between the output wavelength of the optoelectronic assembly and the target wavelength is less than a second predefined value, said second predefined value less than the first predefined value;

storing a value corresponding to the temperature and the one or more operating values once the difference between the output wavelength of the optoelectronic assembly and the target wavelength is less than the second predefined value; and

repeating said selecting step, each of said setting steps, each of said adjusting steps, and said storing step for each additional wavelength in the set of wavelengths.

5. The method of claim 4 , including monitoring a laser temperature from within the optoelectronic assembly and an ambient temperature from within a housing in which the optoelectronic assembly resides, and adjusting the temperature of the optoelectronic assembly as a function of both the monitored laser temperature and the monitored ambient temperature.

6. The method of claim 4 , wherein the value corresponding to the temperature stored for each selected wavelength is within the range of 30° C. and 50° C.

Assignments (4)
PATENT RELEASE AND REASSIGNMENT Recorded Jul 5, 2022
From: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
To: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
Reel/Frame 060574/0001 →
SECURITY INTEREST Recorded Jul 1, 2022
From: II-VI INCORPORATED; II-VI DELAWARE, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; PHOTOP TECHNOLOGIES, INC.; COHERENT, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 060562/0254 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: FINISAR CORPORATION
To: II-VI DELAWARE, INC.
Reel/Frame 052286/0001 →
NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS Recorded Sep 25, 2019
From: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 050484/0204 →