Apparatus and method for setting AC bias point of an optical transmitter module in an optoelectronic transceiver

1. A method for establishing an AC bias level for a laser diode in an optoelectronic transceiver, comprising:

coupling an optical output of said transceiver to an optical input of said transceiver;

setting a DC bias level for said laser diode;

receiving from said transceiver a sequence of optical output power measurements associated with a corresponding sequence of AC bias level settings;

from said received sequence of optical output power measurements determining a preferred AC bias level setting;

establishing said preferred AC bias level setting in said transceiver so as to control said AC bias level of said laser diode;

determining a break point associated with the sequence; and

selecting an AC bias level corresponding to said determined break point.

2. A method for establishing an AC bias level for a laser diode in an optoelectronic transceiver, comprising:

coupling an optical output of said transceiver to an optical input of said transceiver;

setting a DC bias level for said laser diode;

setting an AC bias level for said laser diode to each of a sequence of AC bias level settings;

receiving from said transceiver a sequence of optical output power measurements, including an average optical output power measurement corresponding to each of said AC bias level settings in said sequence;

from said received sequence of power level measurements determining a preferred AC bias level setting; and

establishing said preferred AC bias level setting in said transceiver so as to control said AC bias level of said laser diode;

determining a break point associated with the sequence; and

selecting an AC bias level corresponding to said determined break point.

3. The method of claim 2 , further comprising:

repeating said receiving, determining and storing at a first plurality of temperatures.

4. The method of claim 2 , wherein the break point is a break point in the sequence of optical output power measurements corresponding to a boundary between linear and non-linear operation of said laser diode.

5. The method of claim 2 , wherein the break point is a break point corresponding to a maximum value of a second derivative of the sequence of optical output power measurements, wherein the second derivative is defined with respect to the AC bias level settings corresponding to optical output power measurements in said sequence of optical output power measurements.

6. The method of claim 5 , wherein selecting an AC bias level includes selecting an AC bias level that is at a predetermined offset from said break point.

7. The method of claim 2 , wherein said receiving further comprises:

reading a digital value from a controller IC in said transceiver.

8. The method of claim 2 , wherein said storing further comprises:

storing a digital value in a controller IC in said transceiver.

9. The method of claim 2 , further comprising:

transmitting data through said transceiver while receiving said optical output power measurements.

10. The method of claim 2 , wherein said receiving includes receiving said optical output power measurements from a memory mapped location within said transceiver.

11. A method for setting an AC bias level for a laser diode in an optoelectronic transceiver, comprising:

coupling an optical output of said transceiver to an optical input of said transceiver;

setting a DC bias level for said laser diode;

setting an AC bias level for said laser diode to each of a sequence of AC bias level settings;

receiving from said transceiver a sequence of optical output power measurements, said sequence of optical output power measurements including an average optical output power measurement corresponding to each of said AC bias level settings in said sequence;

from said received sequence of optical output power measurements determining a preferred AC bias level setting;

repeating said receiving and determining at a first plurality of temperatures so as to determine a first plurality of AC bias level settings, each corresponding to a respective temperature in said first plurality of temperatures;

determining from said first plurality of AC bias level settings, a second plurality of AC bias level settings for a second plurality of temperatures, wherein said second plurality of AC bias level settings are greater in number of than said first plurality of AC bias level settings;

storing said second plurality of AC bias level settings in said transceiver;

determining a break point associated with the sequence; and

selecting an AC bias level corresponding to said determined break point.

12. The method of claim 11 , wherein the break point is a break point in said sequence of optical output power measurements corresponding to a boundary between linear and non-linear operation of said laser diode.

13. The method of claim 11 , wherein the break point is a break point corresponding to a maximum value of a second derivative of said sequence of optical output power measurements, wherein said second derivative is defined with respect to said AC bias level settings corresponding to optical output power measurements in said sequence of optical output power measurements.

14. The method of claim 13 , wherein selecting an AC bias level includes selecting an AC bias level that is at a predetermined offset from said break point.

15. The method of claim 11 , wherein said receiving further comprises:

reading a digital value from a controller IC in said transceiver.

16. The method of claim 11 , wherein said storing further comprises:

storing a digital value in a controller IC in said transceiver.

17. The method of claim 11 , further comprising:

transmitting data through said transceiver while receiving said optical output power measurements.

18. The method of claim 11 , wherein said receiving includes receiving said optical output power measurements from a memory mapped location within said transceiver.

19. An apparatus for setting the AC bias level of a laser diode in an optoelectronic transceiver, comprising:

a test apparatus configured to receive a transceiver to be configured, said transceiver having its optical output coupled to its optical input; and

a control apparatus configured to control the operation of said test apparatus and to set an AC bias level of said transceiver based on measurements received from a memory mapped location within said transceiver wherein the AC bias level corresponds to a break point associated with a sequence of optical output power measurements.

20. The apparatus of claim 19 , wherein said control apparatus is further configured to receive said measurements by reading digital values from a controller IC in said transceiver.

21. The apparatus of claim 20 , wherein said control apparatus is further configured to set said AC bias level of said transceiver by storing a digital value in said controller IC in said transceiver.

22. The apparatus of claim 19 , wherein said control apparatus is further configured to transmit data through said transceiver while receiving said optical output power measurements.

23. The apparatus of claim 19 , wherein said test apparatus further comprises:

a temperature control chamber; and

an evaluation board configured to receive said transceiver.

24. An apparatus for setting the AC bias level of a laser diode in an optoelectronic transceiver, comprising:

a test apparatus configured to receive a transceiver to be configured, said transceiver having its optical output coupled to its optical input; and

a control apparatus configured to control the operation of said test apparatus and to set an AC bias level of said transceiver based on measurements received from said transceiver;

wherein said control apparatus is configured to perform a set operations, including:

set a AC bias level for said laser diode;

set an AC bias level for said laser diode to each of a predefined sequence of AC bias level settings;

receive from said transceiver a sequence of optical output power measurements, said sequence at optical output power measurements including an average optical output power measurement corresponding to each of said AC bias level settings in said predefined sequence;

from said received sequence of optical output power measurements, determine a preferred AC bias level setting;

store said preferred AC bias level setting in said transceiver so as to control said AC bias level of said laser diode;

determine a break point associated with the sequence; and

select an AC bias level corresponding to said determined break point.

25. The apparatus of claim 24 , wherein said control apparatus is further configured to:

repeat said receive, determine and store operations at a first plurality of temperatures.

26. The apparatus of claim 24 , wherein the break point is a break point in the sequence of optical output power measurements corresponding to a boundary between linear and non-linear operation of said laser diode.

27. The apparatus of claim 24 , wherein the break point is a break point corresponding to a maximum value of a second derivative of the sequence of optical output power measurements, wherein said second derivative is defined with respect to said AC bias level settings corresponding to optical output power measurements in said sequence of optical output power measurements.

28. The apparatus of claim 27 , wherein said control apparatus is configured to select an AC bias level by selecting an AC bias level that is at a predetermined offset from said break point.

29. The apparatus of claim 24 , wherein said control apparatus is configured to perform said receive operation by reaching a digital value from a controller IC in said transceiver.

30. The apparatus of claim 24 , wherein said control apparatus is configured to perform said store operation by storing a digital value in a controller IC in said transceiver.

31. The apparatus of claim 24 , further configured to transmit data through said transceiver while receiving said optical output power measurements.

32. The apparatus of claim 24 , wherein said control apparatus is configured to perform said receive operation by receiving said optical output power measurements from a memory mapped location with said transceiver.

33. The apparatus of claim 24 , wherein said test apparatus further comprises:

a temperature control chamber; and

an evaluation board configured to receive said transceiver.

34. The apparatus of claim 24 , wherein said test apparatus further comprises a temperature control chamber; and

said control apparatus is further configured to repeat said receiving, determining and storing at a first plurality or temperatures.