Method for measuring the optical and physical thickness of optically transparent objects
View Patent ↗A method and apparatus for measuring the optical thickness and absolute physical thickness of an optically transparent object utilizes a reflective interferometric process. A broadband optical signal is directed toward the object to be measured, and a pair of signals reflected off of the object are processed to determine the optical thickness of the object. When used with an optical fiber preform, the technique can be used to measure the outer diameter of the preform and control the drawing process. If the index of refraction of optically transparent object is known, the absolute physical thickness can also be determined.
1. A method for determining the absolute physical thickness of an optically transparent object of unknown refractive index, the method comprising the steps of:
transmitting a first broadband optical signal across an optically transparent object in the direction associated with a parameter to be measured;
capturing a first pair of reflected signals from said optically transparent object, a first signal of said first pair associated with a near surface reflection of said object and a second signal of said first pair associated with a far surface reflection of said object;
transmitting a second broadband optical signal across the optically transparent object in opposition to said first broadband optical signal;
capturing a second pair of reflected signals from said optically transparent object, a first signal of said second pair associated with a near surface reflection of said object and a second signal of said second pair associated with a far surface reflection of said object;
determining a separation between said first pair of reflected signals and said second pair of reflected signals by comparing the signals in the spectral domain to determine a beat frequency to determine the absolute physical thickness of the optically transparent object.