Method and apparatus for adaptively performing defect scan according to channel characteristics

1. A method of performing a defect scan on a data storage system according to channel characteristics, the method comprising:

measuring characterization values related to respective performances of channels of the data storage system;

determining parameters for each of the channels respectively based on the measured characterization values, such that the parameters for each channel are different and being used for determining the data processing characteristics of the respective channel; and

performing a defect scan on the data storage system using the determined parameters in a data processing procedure for each of the channels.

2. The method of claim 1 , wherein the characterization values comprise bit per error rate values.

3. The method of claim 1 , wherein the parameters comprise a parameter for determining the length of an error correction code for the corresponding channel.

4. The method of claim 1 , wherein the parameters comprise a parameter for determining a write current value for the corresponding channel.

5. The method of claim 1 , wherein the parameters comprise a parameter for determining a read bias current value for the corresponding channel.

6. The method of claim 1 , wherein the parameters comprise a parameter for determining the characteristics of a filter that is used for signal processing for the corresponding channel.

7. The method of claim 1 , wherein the parameters are set differently for each of the respective channels.

8. A method of performing a defect scan in a data storage system comprising:

measuring a first channel characteristic to obtain a first characterization value for a first channel;

measuring a second channel characteristic to obtain a second characterization value for a second channel;

determining a first parameter to match the first characterization value and a second parameter to match the second characterization value using a table stored in a memory device which sets parameters corresponding to predetermined characterization values related to a performance of each of the first and second channels of the data storage system; and

performing a defect scan for the first and second channels according to the corresponding determined first and second parameters, the first parameter being different from the second parameter.

9. The method of claim 8 , wherein the first and second characterization values comprise bit per error rate values for the corresponding one of the first and second channels.

10. The method of claim 8 , wherein each of the first and second parameters comprise a parameter for determining length of an error correction code for the corresponding one of the first and second channels.

11. The method of claim 8 , wherein each of the first and second parameters comprise a parameter for determining a write current value for the corresponding one of the first and second channels.

12. The method of claim 8 , wherein each of the first and second parameters comprise a parameter for determining a read bias current value for the corresponding one of the first and second channels.

13. The method of claim 8 , wherein each of the first and second parameters comprise a parameter for determining characteristics of a filter that is used in signal processing for the corresponding one of the first and second channels.

14. The method of claim 8 , wherein the performing of the defect scan comprises:

determining a retry number for performing the defect scan;

writing test data to each of the channels to determine the position of the defect;

reading the test data from each of the channels;

detecting errors in the test data using a byte-length error correction code;

correcting the errors detected; and

determining whether the errors occurred as a result of the error correction code errors not being corrected.

15. A method of performing a defect scan on a data storage system, the method comprising:

determining a first parameter corresponding to a first channel and a second parameter different from the first parameter for a second channel; and

applying the first parameter to the first channel and the second parameter to the second channel when performing a data processing procedure for the first and second channels during a performance of the defect scan.