Light intensity distribution measuring method and light intensity distribution measuring device
View Patent ↗A light intensity distribution measuring method for measuring the light intensity distribution of a laser beam emitted by a semiconductor laser comprises the steps of measuring light intensities at a plurality of locations in a laser beam emitted by a semiconductor laser and applying their measurement results to a t distribution function to calculate the light intensity distribution. A light intensity distribution measuring device is also described.
1. A light intensity distribution measuring method for measuring the light intensity distribution of a laser beam emitted by a semiconductor laser, comprising the steps of:
measuring light intensities at a plurality of locations in a laser beam emitted by a semiconductor laser; and
applying their measurement results to a t distribution function to calculate the light intensity distribution.
2. The light intensity distribution measuring method as set forth in claim 1 , including the step of using nonlinear least squares for parameters of the t distribution function when said light intensity distribution is calculated.
3. A light intensity distribution measuring device for measuring the light intensity distribution of a laser beam emitted by a semiconductor laser, comprising:
a light intensity detecting means that measures light intensities at a plurality of locations in a laser beam emitted by a semiconductor laser; and
data processing means for calculating the light intensity distribution by applying the measurement results obtained by said light intensity detecting means to a t distribution function.
4. The light intensity distribution measuring device as set forth in claim 3 , wherein said data processing means uses nonlinear least squares for parameters of the t distribution function.