IP Library Granted Patent US 7,232,101
Granted Patent B2
US 7,232,101 · App. 10/723,595 · Granted Jun 19, 2007

Hard drive test fixture

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Quick Facts
Patent No.
US 7,232,101
App. No.
10/723,595
Granted
Jun 19, 2007
Kind
B2
Abstract

The present invention is a method and apparatus for testing electrical or optical devices. The invention includes a test fixture having a base component, a first rail and a second rail coupled to the base component, a top component coupled to the first and second rails, and an interposer coupled to the first and second rails.

Claims (37)

1. A test fixture comprising:

(a) a base component;

(b) a first rail and a second rail coupled to the base component;

(c) a top component coupled to the first and second rails, the top component comprising at least one roller; and

(d) an interposer coupled to the first and second rails.

2. The fixture of claim 1 wherein the base component, the first and second rails, and the top component are configured to achieve vibration damping similar to that achieved by a Golden Fixture.

3. The fixture of claim 1 further comprising at least one roller disposed within a recess in each of the first and second rails.

4. The fixture of claim 1 wherein the base component is coupled to a pan.

5. The fixture of claim 1 wherein the base component is configured to allow air flow around a device being tested.

6. The fixture of claim 1 wherein the first rail and the second rail are configured to allow air flow around a device being tested.

7. The fixture of claim 1 wherein the top component is configured to allow air flow around a device being tested.

8. The fixture of claim 1 wherein the base component comprises

(a) two rail receiving plates; and

(b) at least two braces coupled to the two rail receiving plates.

9. The fixture of claim 8 wherein the at least two braces are configured to allow air flow around a device being tested.

10. The fixture of claim 8 wherein the at least two braces comprise:

(a) at least two main braces, each main brace having an arch structure configured to allow air flow; and

(b) at least one secondary brace disposed between the at least two main braces, the at least one secondary brace configured to allow air flow.

11. The fixture of claim 1 wherein the interposer is configured to interface with a device to be tested.

12. A test fixture comprising:

(a) a base component;

(b) a first rail and a second rail coupled to the base component;

(c) a top component coupled to the first and second rails;

(d) an interposer coupled to the first and second rails; and

(e) an ejection mechanism comprising two rods selectively extendable through apertures in the top component.

13. The fixture of claim 12 wherein the base component, the first and second rails, and the top component are configured to achieve vibration damping similar to that achieved by a Golden Fixture.

14. The fixture of claim 12 further comprising at least one roller disposed within a recess in each of the first and second rails.

15. The fixture of claim 12 wherein the base component is coupled to a pan.

16. The fixture of claim 12 wherein the base component, the first and second rails, and the top component are configured to allow air flow around a device being tested.

17. The fixture of claim 12 wherein the base component comprises

(a) two rail receiving plates; and

(b) at least two braces coupled to the two rail receiving plates.

18. The fixture of claim 17 wherein the at least two braces are configured to allow air flow around a device being tested.

19. The fixture of claim 17 wherein the at least two braces comprise:

(a) at least two main braces, each main brace having an arch structure configured to allow air flow; and

(b) at least one secondary brace disposed between the at least two main braces, the at least one secondary brace configured to allow air flow.

20. The fixture of claim 12 wherein the interposer is configured to interface with a device to be tested.

Assignments (8)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE TO REMOVE BENCHMARK ELECTRONICS, INC. AS ASSIGNEE PREVIOUSLY RECORDED ON REEL 024140 FRAME 0404. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF INTEREST. Recorded Mar 30, 2010
From: BENCHMARK ELECTRONICS, INC.
To: BENCHMARK ELECTRONICS (SUZHOU) CO., LTD.
Reel/Frame 024151/0551 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE ASSIGNEES ADDRESS PREVIOUSLY RECORDED ON REEL 024045 FRAME 0694. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 26, 2010
From: BENCHMARK ELECTRONICS, INC.
To: BENCHMARK ELECTRONICS, INC.; BENCHMARK ELECTRONICS (SUZHOU) CO., LTD.
Reel/Frame 024140/0404 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2010
From: BENCHMARK ELECTRONICS, INC.
To: BENCHMARK ELECTRONICS (SUZHOU) CO., LTD.
Reel/Frame 024045/0694 →
MERGER Recorded Mar 8, 2010
From: BENCHMARK ELECTRONICS MANUFACTURING INC.
To: BENCHMARK ELECTRONICS, INC.
Reel/Frame 024035/0640 →
CHANGE OF NAME Recorded Mar 2, 2010
From: PEMSTAR INC.
To: BENCHMARK ELECTRONICS MANUFACTURING INC.
Reel/Frame 024016/0412 →
RELEASE OF SECURITY INTEREST IN PATENTS AS RECORDED ON 07/18/2006 AT REEL 017946 FRAME 0488 Recorded Apr 5, 2007
From: WACHOVIA CAPITAL FINANCE CORPORATION (CENTRAL), FORMERLY KNOWN AS CONGRESS FINANCIAL CORPORATION (CENTRAL) AS AGENT
To: PEMSTAR INC.
Reel/Frame 019116/0393 →
SECURITY AGREEMENT Recorded Jul 18, 2006
From: PEMSTAR INC.
To: WACHOVIA CAPITAL FINANCE CORPORATION (CENTRAL), AS AGENT
Reel/Frame 017946/0488 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2004
From: WANEK, DONALD; SANDS, RICHARD; WALTER, ROBERT; TROUTMAN, MARK
To: PEMSTAR, INC.
Reel/Frame 015256/0159 →