IP Library Granted Patent US 7,039,082
Granted Patent B2
US 7,039,082 · App. 10/725,871 · Granted May 2, 2006

Calibration of a multi-channel optoelectronic module with integrated temperature control

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Quick Facts
Patent No.
US 7,039,082
App. No.
10/725,871
Granted
May 2, 2006
Kind
B2
Abstract

A method for calibrating a multi-channel laser emitter in an optoelectronic transceiver or an optoelectronic transmitter for a first wavelength includes monitoring the wavelength of optical signals from the laser emitter while varying its temperature as well as other operating conditions, and then storing calibration information in the memory of a microprocessor. The initial values of the calibrating procedure are reset and the calibrating procedure is repeated to obtain calibration information for a next desired wavelength.

Claims (37)

1. A method of calibrating a multichannel optoelectronic assembly comprising:

selecting a first target wavelength;

setting the optoelectronic assembly to a first temperature, wherein the first temperature is in a range of about 30° C. to about 50° C.;

operating the optoelectronic assembly to emit light;

adjusting the first temperature until a difference between an output wavelength of the optoelectronic assembly and the first target wavelength is less than a first predefined value; and

storing a first control value corresponding to the adjustment of the first temperature.

2. The method as recited in claim 1 , further comprising:

selecting a second target wavelength;

setting the optoelectronic assembly to a second temperature, wherein the second temperature is from about 30° C. to about 50° C.;

operating the optoelectronic assembly to emit light;

adjusting the second temperature until a difference between an output wavelength of the optoelectronic assembly and the second target wavelength is less than a second predefined value; and

storing a second control value corresponding to the adjustment of the second temperature.

3. The method as recited in claim 1 , further comprising monitoring the first temperature comprising:

monitoring a laser temperature from within the optoelectronic assembly;

monitoring an ambient temperature outside of the optoelectronic assembly; and

calculating the first temperature as a function of both the monitored laser temperature and the monitored ambient temperature.

4. A method of calibrating a multichannel optoelectronic assembly comprising:

selecting a first target wavelength;

setting the optoelectronic assembly to a first temperature, wherein the first temperature is in a range of about 30° C to about 50° C.;

operating the optoelectronic assembly to emit light;

adjusting the first temperature until a difference between an output wavelength of the optoelectronic assembly and the first target wavelength is less than a first predefined value;

setting a first operating value of the optoelectronic assembly;

adjusting the first operating value until the difference between the output wavelength of the optoelectronic assembly and the target wavelength is less than a second predefined value; and

storing a first control value corresponding to the adjustment of the first temperature and the adjustment of the first operating value.

5. The method as recited in claim 4 , further comprising:

selecting a second target wavelength;

setting the optoelectronic assembly to a second temperature, wherein the second temperature is from about 30° C. to about 50° C.;

operating the optoelectronic assembly to emit light;

adjusting the second temperature until a difference between an output wavelength of the optoelectronic assembly and the second target wavelength is less than a third predefined value; and

setting a second operating value of the optoelectronic assembly;

adjusting the second operating value until the difference between the output wavelength of the optoelectronic assembly and the target wavelength is less than a fourth predefined value; and

storing a second control value corresponding to the adjustment of the second temperature and the adjustment of the second operating value.

6. The method as recited in claim 4 , further comprising monitoring the first temperature comprising:

monitoring a laser temperature from within the optoelectronic assembly;

monitoring an ambient temperature outside of the optoelectronic assembly; and

calculating the first temperature as a function of both the monitored laser temperature and the monitored ambient temperature.

7. The method as recited in claim 4 , wherein the first operating value is selected from the group consisting of DC bias current and AC modulation.

Assignments (4)
PATENT RELEASE AND REASSIGNMENT Recorded Jul 5, 2022
From: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
To: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
Reel/Frame 060574/0001 →
SECURITY INTEREST Recorded Jul 1, 2022
From: II-VI INCORPORATED; II-VI DELAWARE, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; PHOTOP TECHNOLOGIES, INC.; COHERENT, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 060562/0254 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 1, 2020
From: FINISAR CORPORATION
To: II-VI DELAWARE, INC.
Reel/Frame 052286/0001 →
NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS Recorded Sep 25, 2019
From: II-VI INCORPORATED; MARLOW INDUSTRIES, INC.; EPIWORKS, INC.; LIGHTSMYTH TECHNOLOGIES, INC.; KAILIGHT PHOTONICS, INC.; COADNA PHOTONICS, INC.; OPTIUM CORPORATION; FINISAR CORPORATION; II-VI OPTICAL SYSTEMS, INC.; M CUBED TECHNOLOGIES, INC.; II-VI PHOTONICS (US), INC.; II-VI DELAWARE, INC.; II-VI OPTOELECTRONIC DEVICES, INC.; PHOTOP TECHNOLOGIES, INC.
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 050484/0204 →