Scalable scan-path test point insertion technique
A logic circuit comprising at least one input, one output and a delay fault circuit. The delay fault circuit includes a first standard scan cell, a combinational test point positioned immediately after the first standard scan cell in a scan chain and a second standard scan cell positioned immediately after the combinational test point in the scan chain.
1. A logic circuit comprising at least one input, one output and a delay fault circuit, said delay fault circuit including:
a first standard scan cell;
a combinational test point positioned immediately after the first standard scan cell in a scan chain; and
a second standard scan cell positioned immediately after the combinational test point in the scan chain.
2. The logic circuit of claim 1 , where the combinational test point is positioned to prevent shift dependency between the first standard scan cell and the second standard scan cell.
3. The logic circuit of claim 1 , where the first and second standard scan cells are flip-flops.
4. The logic circuit of claim 1 , where the combinational test point comprises an AND gate.
5. The logic circuit of claim 1 , where the combinational test point comprises an OR gate.
6. The logic circuit of claim 1 , where the combinational test point comprises an AND-OR gate.
7. The logic circuit of claim 1 , where the logic circuit is testable under a full standard scan environment.
8. The logic circuit of claim 1 , where the logic circuit is testable under a partial standard scan environment.
9. The logic circuit of claim 1 , where the logic circuit includes at least one enhanced scan cell.
10. The logic circuit of claim 1 , where the circuit is structured so that at least one stuck-at fault in the circuit can be tested.
11. The logic circuit of claim 1 , where the circuit is structured so that at least one delay fault in the circuit can be tested.
12. A logic circuit comprising at least one input, one output and a delay fault circuit, said delay fault circuit including:
a first standard scan cell; a test point positioned immediately after the first standard scan cell in a scan chain; and
a second standard cell positioned immediately after the test point in the scan chain,
where the test point is positioned to prevent shift dependency identified to occur between the first and second standard scan cells in the delay fault circuit.
13. The logic circuit of claim 12 , where the position of the test point is determined based on a functional analysis of the circuit.
14. The logic circuit of claim 12 , wherein the test point is a dummy scan flip-flop in a scan chain that does not provide input to any primary inputs in the logic circuit.
15. The logic circuit of claim 12 , wherein the test point is a combinational test point.
16. The logic circuit of claim 12 , wherein the position of the test point is determined by:
identifying dependency untestable transition delay faults;
for every such fault,
generating a test cube pair for the fault if the fault has a minimum test generation cost, and
if there is no conflict with any other test cube pair in a current test cube pair set, adding the test cube pair into the current test cube pair set and updating a current test point vector based on the current test cube pair set; and
generating a global test point vector based on the current test point vector, where the global test point vector specifies the position where the test point should be inserted.
17. The logic circuit of claim 16 , where the global test vector also specifies what type of test point should be inserted.
18. A method of testing a logic circuit comprising:
loading a first test pattern into a first standard scan cell in a scan chain;
loading an output of the first standard cell into a combinational test point in the scan chain; and
loading an output of the combinational test point into a second standard scan cell in the scan chain.
19. The method of testing a logic circuit as in claim 18 , where the combinational test point prevents shift dependency between the first standard scan cell and the second standard scan cell.
20. The method of claim 18 , where the logic circuit is testable under a full standard scan environment.
21. The method of claim 18 , where the logic circuit is testable under a partial standard scan environment.
22. The method of claim 18 , where the logic circuit includes at least one enhanced scan cell.
23. The method of claim 18 , where at least one stuck-at fault in the logic circuit is tested.
24. The method of claim 18 , where at least one delay fault in the logic circuit is tested.
25. The method of claim 18 , where the combinational test point comprises an AND gate.
26. The method of claim 18 , where the combinational test point comprises an OR gate.
27. The method of claim 18 , where the combinational test point comprises an AND-OR gate.
28. An integrated circuit comprising at least one logic circuit and at least one delay fault circuit, the delay fault circuit including:
a first standard scan cell in a scan chain;
a combinational test point positioned immediately after the first standard scan cell in the scan chain; and
a second standard scan cell positioned immediately after the combinational test point in the scan chain.
29. The integrated circuit of claim 28 , where the first and second scan cells are flip-flops.
30. The integrated circuit of claim 28 , where the combinational test point is positioned to prevent shift dependency between the first standard scan cell and the second standard scan cell.
31. The integrated circuit of claim 28 , where the combinational test point further comprises an AND gate, an OR gate, or an AND-OR gate.
32. A method for designing a circuit that is testable using a scan-based technique comprising:
accurately identifying, based on a functional analysis of the circuit, at least one pair of standard scan cells in the circuit where shift dependency occurs; and
inserting a test point at the identified point in the circuit.
33. The method of claim 32 , where the inserted test points are dummy scan memories.
34. The method of claim 33 , where the scan memories are flip-flops.
35. The method of claim 32 , where the inserted test points are combinational gates.
36. The method of claim 32 , where the points in the circuit where shift dependency occurs are identified using an automatic test program generator (ATPG).
37. The method of claim 36 , where the ATPG identifies scan memories between which the test points are inserted.
38. The method of claim 37 , where the scan memories are flip-flops.