IP Library Granted Patent US 6,876,039
Granted Patent B2
US 6,876,039 · App. 10/739,200 · Granted Apr 5, 2005

Variable threshold voltage complementary MOSFET with SOI structure

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Quick Facts
Patent No.
US 6,876,039
App. No.
10/739,200
Granted
Apr 5, 2005
Kind
B2
Abstract

The dependency of threshold voltage on adjusted bias voltage is varied between N-channel and P-channel MOSFETs. A support substrate, an insulating layer on the support substrate, and island-shaped first and second silicon layers separately formed on the insulating layer; a first MOSFET formed of a fully depleted SOI where a first channel part is formed in a first silicon layer; and a second MOSFET formed of a partially depleted SOI where a second channel part is formed in a second silicon layer, the second MOSFET configures a complementary MOSFET with the first MOSFET, are provided. The threshold voltage of the second MOSFET formed of the partially depleted SOI is hardly varied because of a neutral region in the second channel part, although bias voltage is applied to the support substrate to vary the threshold voltage of the first MOSFET formed of the fully depleted SOI.

Claims (16)

1. A variable threshold voltage complementary MOSFET with an SOI structure comprising:

an SOI substrate main body having a support substrate, an insulating layer disposed on the support substrate, and island-shaped first and second silicon layers separately formed on the insulating layer;

a first MOSFET formed of a fully depleted SOI where a first channel part is formed in the first silicon layer;

a second MOSFET formed of a partially depleted SOI where a second channel part is formed in the second silicon layer, the second MOSFET configured as a complementary MOSFET with the first MOSFET; and

an adjusted bias electrode disposed on the support substrate for applying to the SOI substrate main body an adjusted bias voltage that adjusts threshold voltage of the complementary MOSFET,

wherein the first MOSFET has a first source region and a first drain region formed in the first silicon layer that sandwich the first channel part, and a first gate electrode disposed on the first channel part with a first gate insulating film sandwiched therebetween, and

the second MOSFET has a second source region and a second drain region in the second silicon layer that sandwich the second channel part, a second gate electrode formed on the second channel part with a second gate insulating film sandwiched therebetween, a neutral region in the second silicon layer where a depletion layer is not formed so that adjusting of the threshold voltage of the second MOSFET responsive to the adjusted bias voltage is suppressed, and a suppressed voltage electrode disposed so as to contact with the neutral region for applying suppressed voltage to the neutral region to suppress the threshold voltage.

2. The variable threshold voltage complementary MOSFET with the SOI structure according to claim 1 , wherein the first MOSFET is an N-channel MOSFET and the second MOSFET is a P-channel MOSFET.

3. The variable threshold voltage complementary MOSFET with the SOI structure according to claim 1 , wherein the first MOSFET is a P-channel MOSFET and the second MOSFET is an N-channel MOSFET.

4. A variable threshold voltage complementary MOSFET with an SOI structure comprising:

an SOI substrate main body having a support substrate, an insulating layer disposed on the support substrate, and island-shaped first and second silicon layers separately formed on the insulating layer;

a first MOSFET formed of a fully depleted SOI where a first channel part is formed in the first silicon layer;

a second MOSFET formed of a partially depleted SOI where a second channel part is formed in the second silicon layer, the second MOSFET configured as a complementary MOSFET with the first MOSFET; and

an adjusted bias electrode disposed on the support substrate for applying an adjusted bias voltage, the adjusted bias voltage selectively adjusts the first MOSFET formed of the fully depleted SOI independently from the second MOSFET formed of the partially depleted SOI.

5. The variable threshold voltage complementary MOSFET with the SOI structure according to claim 4 , wherein the first MOSFET is an N-channel MOSFET and the second MOSFET is a P-channel MOSFET.

6. The variable threshold voltage complementary MOSFET with the SOI structure according to claim 4 , wherein the first MOSFET is a P-channel MOSFET and the second MOSFET is an N-channel MOSFET.

Assignments (3)
CHANGE OF NAME Recorded Mar 21, 2014
From: OKI SEMICONDUCTOR CO., LTD
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 032495/0483 →
CHANGE OF NAME Recorded Dec 24, 2008
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 022052/0797 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2003
From: OKIHARA, MASAO
To: OKI ELECTRIC INDUSTRY CO., LTD.
Reel/Frame 014824/0125 →