Method and apparatus for accelerated SER testing of circuitry
View Patent ↗One embodiment of the present invention provides a system that facilitates accelerated Soft-Error Rate (SER) testing of circuitry. The system starts by collecting a radioactive gas from the atmosphere and concentrating the radioactive gas in a testing chamber. Once the desired amount of radioactive gas is present in the testing chamber, the system SER tests the circuitry in the testing chamber by bombarding the circuitry with particles emitted from the radioactive gas while running testing procedures.
1. A method for accelerated Soft-Error Rate (SER) testing of circuitry, comprising:
collecting a radioactive gas from the atmosphere, wherein the radioactive gas is Radon, and wherein collecting the radioactive gas involves passing air from the atmosphere through oil so that the radioactive gas becomes trapped in the oil;
concentrating the radioactive gas in a testing chamber; and
SER testing the circuitry in the testing chamber, wherein the circuitry is bombarded by particles emitted from the radioactive gas;
wherein using the radioactive gas from the atmosphere for SER testing provides increased safety margins for test personnel.
2. The method of claim 1 , wherein the circuitry comprises an integrated circuit.
3. The method of claim 2 , wherein the integrated circuit comprises a memory chip.
4. The method of claim 1 , wherein the oil is corn oil.
5. The method of claim 1 , wherein concentrating the radioactive gas further comprises:
releasing the radioactive gas from the oil; and
moving the radioactive gas into the testing chamber until a specified amount of the radioactive gas has been concentrated.
6. The method of claim 5 , wherein releasing the radioactive gas from the oil further involves heating the oil, wherein heating the oil allows the radioactive gas to escape from the oil.
7. An apparatus for accelerated Soft-Error Rate (SER) testing of circuitry, comprising:
a collection mechanism configured to collect a radioactive gas from the atmosphere, wherein the radioactive gas is Radon;
a concentration mechanism configured to concentrate the radioactive gas in a testing chamber, wherein the concentration mechanism is further configured to pass air from the atmosphere through oil so that the radioactive gas becomes trapped in the oil; and
a testing mechanism configured to SER test the circuitry in the testing chamber, wherein the circuitry is bombarded by particles emitted from the radioactive gas;
wherein using the radioactive gas from the atmosphere for SER testing provides increased safety margins for test personnel.
8. The apparatus of claim 7 , wherein the circuitry comprises an integrated circuit.
9. The apparatus of claim 8 , wherein the integrated circuit comprises a memory chip.
10. The apparatus of claim 7 , wherein the oil is corn oil.
11. The apparatus of claim 7 , wherein the concentration mechanism further comprises:
a degassing mechanism configured to release the radioactive gas from the oil; and
a transport mechanism configured to move the radioactive gas into the testing chamber until a specified amount of the radioactive gas has been concentrated.
12. The apparatus of claim 11 , wherein the degassing mechanism is further configured to heat the oil, wherein heating the oil allows the radioactive gas to escape from the oil.
13. A means for accelerated Soft-Error Rate (SER) testing of circuitry, comprising:
a collection means for collecting a radioactive gas from the atmosphere, wherein the radioactive gas is Radon;
a concentration means for concentrating the radioactive gas in a testing chamber, wherein the concentration mechanism is further configured to pass air from the atmosphere through oil so that the radioactive gas becomes trapped in the oil; and
a testing means for SER testing the circuitry in the testing chamber, wherein the circuitry is bombarded by particles emitted from the radioactive gas;
wherein using the radioactive gas from the atmosphere for SER testing provides increased safety margins for test personnel.