Method for generating electromagnetic field distributions
View Patent ↗This invention relates to a platform ( 11 ) and a method for generating electromagnetic field distributions. The invention relates in particular to optical sensors for measuring biological or chemical substances. The platform ( 11 ) according to the invention comprises a substrate ( 13 ), a structured layer ( 19 ) and, positioned between the substrate ( 13 ) and the structured layer ( 19 ), a multilayer assembly ( 17 ), said components being so matched relative to one another that upon appropriate impingement by electromagnetic radiation an electromagnetic field distribution is generated that is at a maximum within the structured layer ( 19 ).
1. Platform for generating an electromagnetic field distribution, comprising
a substrate
a structured layer provided on the substrate
coupling means for coupling impinging electromagnetic radiation into said structured layer so as to generate an electromagnetic field distribution within the structured layer
a multilayer assembly between the substrate and the structured layer, said multilayer assembly forming means for at least substantially decoupling the electromagnetic field distribution in the structured layer from the substrate with regard to spectral orders other than zero order.
2. Platform as in claim 1 , wherein the structured layer has a first refractive index and the substrate has a second refractive index, and further wherein the first refractive index is less than 1% greater than the second refractive index.
3. Platform as in claim 1 , wherein a profile of the structured layer encompasses periodically spaced conformations that constitute a part of the coupling means.
4. Platform as in claim 1 , wherein the multilayer assembly comprises metallic layers consisting of Al and/or Ag.
5. Platform as in claim 1 , wherein the multilayer assembly comprises dielectric layers and no metallic layers.
6. The platform of claim 1 , said multilayer assembly forming means for completely decoupling the electromagnetic field distribution in the structured layer from the substrate with regard to spectral orders other than zero order.
7. The platform of claim 1 , wherein the structured layer has a first refractive index and the substrate has a second refractive index, and further wherein the first refractive index is lower than the second refractive index.
8. A measuring system, comprising:
a light source;
a detector; and
a measuring chip including the platform of claim 1 , wherein the light source produces a light beam for impingement on the measuring chip.
9. The platform of claim 5 , wherein the multilayer assembly is constructed in an alternating layer fashion with alternating high- and low-refraction layers.
10. Method for generating an enhanced and not exclusively evanescent electromagnetic field distribution, comprising the following steps of:
selecting a substrate
selecting a first material for and a structural profile of a structured layer
selecting a second material for a multilayer assembly
defining parameters of an electromagnetic radiation to be employed for an exposure
simulating and optimizing the electromagnetic field distribution within a platform comprising the substrate, the multilayer assembly and the structured layer upon impingement by electromagnetic radiation of the defined parameters, with the multilayer assembly positioned between the substrate and the structured layer and an objective of the step of optimizing being a field distribution that is at its maximum within the structured layer;
constructing the platform in a manner that at least approximates a result of the step of optimizing, wherein said multilayer assembly forms means for at least substantially decoupling the electromagnetic field distribution in the structured layer from the substrate with regard to spectral orders other than zero order; and
impinging the electromagnetic radiation on the platform along the defined parameters.
11. Method as in claim 10 , wherein a second objective of the step of optimizing is a field distribution that exhibits at least one maximum in regions of the structured layer that are devoid of the first material.
12. A platform for generating an electromagnetic field distribution, comprising:
a substrate;
a structured layer provided on the substrate, said structured layer forming diffraction structures for coupling impinging electromagnetic radiation into said structured layer so as to generate an electromagnetic field distribution within the structured layer;
a multilayer assembly located between the substrate and the structured layer, said multilayer assembly forming means for substantially decoupling the electromagnetic field distribution in the structured layer from the substrate with regard to spectral orders other than zero order, wherein a diffractive efficiency of said diffraction structures is chosen such that the diffraction structures and the multilayer assembly together cause the electromagnetic field distribution to have a maximum intensity within the structured layer.
13. Sensor with a platform as in claims 1 , 2 , 3 , 4 , 5 , 7 , 9 or 12 wherein the sensor is adapted to measure specific substances in a biological and/or chemical and/or biochemical sample.