System and method for self-adaptive redundancy choice logic
A system and method for self-adaptive redundancy choice logic uses BIST data to determine if a memory is functional. If a portion of the memory is not functional, the system and method selects a redundant memory section for use. A BIST is then run a second time to confirm the functionality of the selected redundant memory section.
1 . A method, comprising:
determining if a memory is functional based on memory BIST data;
selecting a redundant memory section if a portion of the memory is determined to be nonfunctional; and
determining if at least the selected redundant memory is functional according to a BIST.
2 . The method of claim 1 , further comprising storing data indicating the selected redundant memory section.
3 . The method of claim 1 , further comprising outputting a pass or fail signal based on the determining if at least the selected redundant memory is functional according to a BIST.
4 . The method of claim 1 , wherein the redundant memory section includes a column or row.
5 . The method of claim 1 , wherein the redundant memory section includes a bit.
6 . The method of claim 1 , wherein the selecting selects a redundant memory section from a redundant memory data structure.
7 . The method of claim 6 , further comprising updating the redundant memory data structure to indicate that the selected redundant memory section is no longer redundant.
8 . The method of claim 1 , wherein the method is performed during a manufacturing process.
9 . The method of claim 1 , wherein the method is performed during power up of an integrated circuit.
10 . A system, comprising:
means for determining if a memory is functional based on memory BIST data;
means for selecting a redundant memory section if a portion of the memory is determined to be nonfunctional; and
means for determining if at least the selected redundant memory is functional according to a BIST.
11 . A system, comprising:
a BIST capable of determining if a memory is functional; and
self-adaptive logic, communicatively coupled to the BIST, capable of selecting a redundant memory section if a portion of the memory is determined to be nonfunctional;
wherein the BIST is further capable of determining if at least the selected redundant memory is functional.
12 . The system of claim 11 , further comprising a register communicatively coupled to the self-adaptive logic and wherein the self-adaptive logic is further capable of storing data indicating the selected redundant memory section in the register.
13 . The system of claim 11 , further comprising a pin and wherein the self-adaptive logic if further capable of outputting a pass or fail signal based on the BIST determination of the functionality of the selected redundant memory.
14 . The system of claim 11 , wherein the redundant memory section includes a column or row.
15 . The system of claim 11 , wherein the redundant memory section includes a bit.
16 . The system of claim 11 , further comprising a redundant memory data structure listing redundant memory sections and wherein the self-adaptive logic selects a redundant memory section from the redundant memory data structure.
17 . The system of claim 11 , wherein the self-adaptive logic is further capable updating the redundant memory data structure to indicate that the selected redundant memory section is no longer redundant.
18 . The system of claim 11 , wherein the BIST and the self-adaptive logic function during a manufacturing process.
19 . The system of claim 11 , wherein the BIST and the self-adaptive logic function during power up of the system.