IP Library Granted Patent US 7,095,066
Granted Patent B2
US 7,095,066 · App. 10/753,246 · Granted Aug 22, 2006

Process for making a CMOS image sensor

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Quick Facts
Patent No.
US 7,095,066
App. No.
10/753,246
Granted
Aug 22, 2006
Kind
B2
Abstract

An image sensor includes a semi-conducting substrate having a photo-sensitive region and doping for forming a path to a charge-to-voltage mechanism; a dielectric spanning the substrate; and a semi-conducting layer, which is less than approximately 1 micrometer, spanning the dielectric which contains electrodes and circuit elements that control flow of charge.

Claims (23)

1. An image sensor comprising:

(a) a semi-conducting substrate having a photo-sensitive region and doping for forming a path to a charge-to-voltage mechanism;

(b) a dielectric spanning the substrate; and

(c) a single crystal semi-conducting layer, which is less than approximately 1 micrometer, spanning the dielectric which contains electrodes and circuit elements that control flow of charge.

2. The image sensor as in claim 1 , wherein the semi-conducting substrate and semi-conducting layer are silicon.

3. The image sensor as in claim 2 , wherein the dielectric is silicon dioxide.

4. The image sensor as in claim 3 , wherein the semi-conducting substrate includes an epitaxial layer.

5. The image sensor as in claim 1 further comprising doping for a reset transistor in the semi-conducting substrate and a reset gate in the semi-conducting layer.

6. The image sensor as a claim 1 , wherein the photo-sensitive region is a photodiode.

7. The image sensor as in claim 1 , wherein the charge-to-voltage mechanism is a floating diffusion.

8. The image sensor as in claim 1 , wherein the image sensor is a CMOS image sensor.

9. A camera comprising:

an image sensor comprising:

(a) a semi-conducting substrate having a photo-sensitive region and doping for forming a path to a charge-to-voltage mechanism;

(b) a dielectric spanning the substrate; and

(c) a single crystal semi-conducting layer, which is less than approximately 1 micrometer, spanning the dielectric which contains electrodes and circuit elements that control flow of charge.

10. The camera as in claim 9 , wherein the semi-conducting substrate and semi-conducting layer are silicon.

11. The camera as in claim 10 , wherein the dielectric is silicon dioxide.

12. The camera as in claim 11 , wherein the semi-conducting substrate includes an epitaxial layer.

13. The camera as in claim 9 further comprising doping for a reset transistor in the semi-conducting substrate and a reset gate in the semi-conducting layer.

14. The camera as in claim 9 , wherein the photo-sensitive region is a photodiode.

15. The camera as in claim 9 , wherein the charge-to-voltage mechanism is a floating diffusion.

16. The camera as in claim 9 , wherein the image sensor is a CMOS image sensor.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2011
From: EASTMAN KODAK COMPANY
To: OMNIVISION TECHNOLOGIES, INC.
Reel/Frame 026227/0213 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 8, 2004
From: LAVINE, JAMES P.
To: EASTMAN KODAK COMPANY
Reel/Frame 014882/0255 →