IP Library Granted Patent US 6,888,128
Granted Patent B2
US 6,888,128 · App. 10/754,088 · Granted May 3, 2005

Virtual wall gas sampling for an ion mobility spectrometer

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Quick Facts
Patent No.
US 6,888,128
App. No.
10/754,088
Granted
May 3, 2005
Kind
B2
Abstract

The presence of trace molecules in air may be determined using an ion mobility spectrometer. Such devices may be used in the fields of explosives detection, identification of narcotics, and in applications characterized by the presence of very low airborne concentrations of organic molecules of special interest. The sensitivity of such instruments may depend upon on the method of gas sampling utilized. A virtual wall gas sampling system can greatly improve the sampling efficiency, particularly when the sampling needs to be performed at a distance from the air intake and large volumes need to be sampled. The virtual wall gas sampling system consists of an intake gas flow and a separate group of one or more sheet-like gas flows, which may be either mutually deflected to move with a circular motion or may be formed into a cylindrical bounding surface.

Claims (42)

1. A gas sampling system for an ion mobility spectrometer comprising:

a first gas pump that provides a first gas flow at a partial gas vacuum compared to ambient gas pressure;

a second gas pump that provides a second gas flow, different from said first gas flow, at a partial gas pressure compared to the ambient gas pressure;

a first orifice in communication with the first gas pump to provide the first gas flow in a first gas flow direction toward the first gas pump, wherein the first gas flow is external to said ion mobility spectrometer;

tubulation means connecting said first orifice to said ion mobility spectrometer;

a plurality of orifices in communication with said second gas pump to provide said second gas flow that substantially surrounds said first gas flow to increase vacuum at a sampling location distal from the first orifice and;

means for directing said second gas flow in a direction with a normal axis of said second gas flow and a direction of flow both being substantially perpendicular to said first gas flow direction and enclosing in part a gas sampling volume.

2. A gas sampling system as in claim 1 wherein said partial gas vacuum is within 50 millimeters of mercury (50 Torr) of the ambient gas pressure.

3. A gas sampling system as in claim 1 wherein said second gas flow is provided by an air knife.

4. A gas sampling system as in claim 1 wherein said second gas flow is provided by an air curtain.

5. A gas sampling system as in claim 1 wherein said second gas flow is provided by an air door.

6. A gas sampling system as in claim 1 wherein said means for directing said second gas flow is provided by a nozzle.

7. A gas sampling system as in claim 1 wherein said means for directing said second gas flow is provided by the Coanda effect.

8. A gas sampling system as in claim 1 wherein said means for directing said second gas flow is provided by deflection vanes.

9. A gas sampling system as in claim 1 wherein said second gas flow may be at least one of: substantially cylindrical in shape or in the shape of at least one planar surface.

10. A gas sampling system as in claim 1 wherein said second gas flow is directed slightly outward from the axis of said first orifice to compensate for the inward force due to the pressure differential across said second gas flow.

11. A gas sampling system as in claim 1 wherein said second gas flow induces a vortex about said first gas flow.

12. A gas sampling system, comprising:

an ion mobility spectrometer having a sampling orifice through which a sampling gas flow passes in a sampling gas flow direction; and

at least one sheet-like gas flow source that creates at least one sheet-like gas flow virtual wall that is different from the sampling gas flow and is beyond the sampling orifice, the at least one sheet-like gas flow virtual wall forming at least part of a boundary of an enclosed volume used for gas sampling, wherein a normal axis of the sheet-like gas flow is substantially perpendicular to the sampling gas flow direction and wherein a flow direction of the sheet-like gas flow is also substantially perpendicular to the sampling gas flow direction.

13. A gas sampling system, according to claim 12 , wherein the ion mobility spectrometer operates at substantially ambient gas pressure.

14. A gas sampling system according to claim 12 , wherein a gas pump draws the sampling gas flow through the sampling orifice and generates a vacuum within 50 millimeters of mercury (50 Torr) of the substantially ambient gas pressure.

15. A gas sampling system according to claim 12 , wherein a plurality of sheet-like air flow sources provide a plurality of sheet-like air flows that form a rotary air flow in either the clockwise or counterclockwise direction.

16. A gas sampling system according to claim 12 , further comprising:

a gas pump connected to the orifice that causes the sampling gas flow from inside the enclosed volume to flow into the ion mobility spectrometer.

17. A gas sampling system, comprising:

at least one source that produces at least one sheet-like air flow used to define an enclosed sample volume; and

an orifice coupled to said enclosed sample volume, said orifice providing a partial vacuum to cause gas to flow in a sampled gas direction from within said enclosed sample volume to said orifice, wherein the sampled gas direction is substantially perpendicular to both a direction of flow of the sheet-like air flow and a normal axis to the sheet-like air flow.

18. A gas sampling system as in claim 17 wherein said sheet-like flow is provided by an air knife.

19. A gas sampling system as in claim 17 wherein said sheet-like flow is provided by an air curtain.

20. A gas sampling system as in claim 17 wherein said sheet-like flow is provided by an air door.

21. A gas sampling system as in claim 17 wherein said sheet-like flow is provided by a nozzle.

22. A gas sampling system as in claim 17 wherein said sheet-like flow is provided by the Coanda effect.

23. A gas sampling system as in claim 17 wherein said sheet-like flow is provided by deflection vanes.

24. A method of sampling gas, comprising:

forming an enclosed volume around the gas using at least one virtual wall provided by a sheet-like air flow; and

receiving a sampling gas flow moving in a sampling gas flow direction for sampling from within the enclosed volume, wherein a normal axis to the sheet-like air flow is substantially perpendicular to the sampling gas flow direction and wherein a direction of flow of the sheet-like air flow is also substantially perpendicular to the sampling gas flow direction.

25. A method, according to claim 24 , further comprising:

providing a plurality of sheet-like air flows.

26. A method, according to claim 25 , wherein the sheet-like air flows flow in a rotary direction having an axis of rotation that is substantially parallel to a direction of gas flow in connection with receiving gas from within the enclosed volume.

27. A method, according to claim 24 , further comprising:

after receiving gas for sampling, providing the gas to an ion mobility spectrometer.

Assignments (8)
CHANGE OF NAME Recorded Feb 26, 2021
From: L3 SECURITY AND DETECTION SYSTEMS, INC.
To: LEIDOS SECURITY DETECTION AND AUTOMATION INC.
Reel/Frame 055430/0816 →
BANKRUPTCY ORDER TO RELEASE LEGACY LIENS Recorded Feb 24, 2020
From: BAM ADMINISTRATIVE SERVICES LLC
To: IMPLANT SCIENCES CORPORATION; C ACQUISITION CORP.; ACCUREL SYSTEMS INTERNATIONAL CORPORATION; IMX ACQUISITION CORP.
Reel/Frame 052783/0013 →
CHANGE OF NAME Recorded Nov 20, 2019
From: L-3 COMMUNICATIONS SECURITY AND DETECTION SYSTEMS, INC.
To: L3 SECURITY & DETECTION SYSTEMS, INC.
Reel/Frame 051060/0865 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 12, 2019
From: IMPLANT SCIENCES CORPORATION; C ACQUISITION CORP; ACCUREL SYSTEMS INTERNATIONAL CORPORATION; IMX ACQUISITION CORP.
To: L-3 COMMUNICATIONS SECURITY AND DETECTION SYSTEMS, INC.
Reel/Frame 050979/0504 →
SECURITY INTEREST Recorded Jan 26, 2016
From: IMPLANT SCIENCES CORPORATION; C ACQUISITION CORP.; ACCUREL SYSTEMS INTERNATIONAL CORPORATION; IMX ACQUISITION CORP.
To: BAM ADMINISTRATIVE SERVICES LLC
Reel/Frame 037584/0124 →
SECURITY AGREEMENT Recorded Dec 3, 2009
From: ACCUREL SYSTEMS INTERNATIONAL CORPORATION; IMPLANT SCIENCES CORPORATION; C-ACQUISITION CORP.; IMX ACQUISITION CORPORATION
To: DMRJ GROUP, LLC
Reel/Frame 023594/0506 →
SECURITY AGREEMENT Recorded Jan 13, 2009
From: ACCUREL SYSTEMS INTERNATIONAL CORPORATION
To: DMRJ GROUP, LLC
Reel/Frame 022092/0662 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2004
From: KRASNOBAEV, LEONID YA.; BUNKER, STEPHEN N.
To: IMPLANT SCIENCES CORPORATION
Reel/Frame 015255/0537 →