Optical analysis systems
View Patent ↗A system for optical detection of kinetic samples. The system includes a dual set of detectors linked to a single processor. The time of signal integration is different for each detector, allowing one detector to have a higher sensitivity by integrating over a longer time period while the second detector using shorter integration periods is able to measure kinetic events.
1. A system for optical analysis of targets comprising:
an illumination source producing an illumination beam;
a stage for holding a sample onto which said illumination beam is directed;
a first objective lens collecting light from said sample and transmitting said light as a collected light beam;
a first imaging lens that receives collected light from said objective lens and focuses said collected light;
a first area array detector positioned to detect collected light focused by said first imaging lens;
a second objective lens collecting light from said sample and transmitting said light as a collected light beam;
a second imaging lens that receives collected light from said objective lens and focuses said collected light;
a second area array detector positioned to detect collected light focused by said first imaging lens;
a processor that simultaneously integrates signals from said first and said second detector, wherein said processor integrates a signal from a first detector for a first time interval and said processor integrates a signal from said processor for a second time interval, wherein said first time interval is shorter than said second time interval.
2. The system of claim 1 , wherein said first area array detector and said second area array detector are selected from a group comprising CCD detectors, CID detectors, CMOS detectors, and photodiode array detectors.
3. The system of claim 1 , wherein said illumination source is an arc lamp.
4. The system of claim 3 , wherein the illumination beam is directed by an optical fiber onto the sample.
5. The system of claim 1 , further comprising an illumination filter placed in the path of the illumination light.
6. The system of claim 5 , further comprising an illumination filter holder that allows one of a plurality of illumination filters to be positioned in the path of the illumination light.
7. The system of claim 1 , wherein the first and second area array detectors are selected from the group consisting of a CCD detector, a CID detector, a CMOS detector or a photodiode array detector.
8. The system of claim 1 , wherein said sample holding stage may be selectively moved along a z-axis.
9. The system of claim 1 , further including an autofocus system.
10. The system of claim 9 , wherein said autofocus system includes a laser directed onto a reflective substrate on the sample holding stage, an array detector positioned to detect the reflected light, and a processor, wherein said processor determines the focus on the substrate by the location on the array detector to which reflected light is detected.
11. The system of claim 1 , wherein said stage includes an adapter held on said stage.